A key benefit of micro-XRF is the minimal requirements for sample preparation. Nevertheless an analytical plane must be defined for the measurements. Many samples are not perfectly planar, nor can they be altered (i.e. important historical museum artifacts). For qualitative analysis (e.g. maps or line scans) of samples with topography, parts of the surface will be outside the focal plane. The Aperture Management System (AMS) aims to increase the depth of field. Just like optical imaging – but for very different reasons – an aperture before the lens increases the depth of field. Therewith, even for samples with high topography, most structures remain in focus, that is, within the focal plane.