Hyperspectral Characterization of Advanced Materials using AFM
AFM DataCube Modes - Comprehensive Multidimensional Nanoscale Analysis
AFM is widely used to determine the electrical, mechanical, and chemical properties of samples at the nanometer scale. In this webinar, we will present an array of electrical AFM techniques that expand the capabilities of traditional AFM modes by enabling the collection of a spectrum in every XY pixel and the creation of rich multidimensional datasets, referred to as DataCubes.
DataCube modes, such as DataCube-TUNA, DataCube-PFM and DataCube-sMIM, as well as Hyperspectral AFM-IR and Force Volume AFM-IR allow the simultaneous capture of nanometer-scale electrical, chemical, and mechanical characteristics, and their correlation with spectra that reveal additional information, such as conduction type, charge, and performance transitions, information that was previously impossible to attain in a single measurement.
This hyperspectral approach significantly increases the ease and efficiency of material characterization and enables a comprehensive multidimensional, nanoscale analysis.
In this on-demand webinar, Bruker speakers give an overview of Bruker’s DataCube modes and perform a live demonstration illustrating their capabilities.
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Bruker Speakers
Hartmut Stadler, Ph.D.
Applications Engineer, Bruker Nano GmbHHartmut Stadler works as an application scientist for Bruker Nano Surfaces and is now mainly focussed on the chemical side of AFM, including electrochemical operation and nanoscale IR techniques. His background is Physical Chemistry, with a PhD thesis in the field of biofilm characterization using macroscopic and nanoscopic methods. Since more than 25 years he operates AFMs and since more than 20 years he supports Bruker’s European AFM customers and distribution channel partners in AFM-application related questions.
Khaled Kaja, Ph.D., Applications Scientist
Dr. Khaled Kaja holds a PhD in Nanophysics from the University of Grenoble. He started his research journey at the Leti laboratory (French commission of atomic and alternative energies, CEA) working on the development of highly-resolved nanoelectrical AFM measurements. Following a post-doctoral training at the Swiss federal institute (ETH) Zurich under the chair of nanotechnology (Prof. Dr. Andreas Stemmer), he moved to the UK joining Bruker nano surfaces as an applications scientist. In 2017, Dr. Kaja moved to the middle east as an assistant professor of physics at different universities in the region. Later in 2020, he joined the French national metrology lab (LNE) as a research scientist working on the development of nanoelectrical metrology. Recently, Dr. Kaja joined Bruker nano surfaces and metrology in Karlsruhe (Germany) as an applications scientist. His main research interests are focused on the development of novel nanoelectrical AFM methods applied to 2D materials and low dimensional systems.
Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA