As consumer electronics become sleeker and smaller, they also increase in computing power and data storage capacity. Electronics development scientists often need to map the electronic characteristics of complex, sub-micron electrical materials and assemblies.
Electric Force Microscopy (EFM) measures electric field gradient distribution above the sample surface. EFM, like Magnetic Force Microscopy (MFM) relies on LiftMode™, a two-pass technique that interleaves TappingMode™ scan lines at the sample surface with scan lines at a designated height above the surface.
EFM is used for electrical failure analysis, detecting trapped charges, mapping electric polarization, and performing electrical read/write, among other applications. It is part of Bruker’s extensive suite of nanoelectrical characterization modes.