AFM 模式

静电力显微镜（EFM）

采用TappingMode在形貌成像的同时进行电场检测

随着消费电子产品变得更加时尚精巧，它们的计算能力和数据存储容量也随之增加。电子产品开发科学家经常需要绘制复杂的亚微米电子材料和组件的电学特性图。

静电力显微镜（EFM）可测量样品表面上方的电场梯度分布。EFM与磁力显微镜（MFM）一样，都依赖于LiftMode™，这是一种两遍扫描技术，在样品表面的TappingMode™ 与表面上方指定高度上分别进行线扫描。

EFM用于电气故障分析、检测束缚电荷、进行电极化成像以及执行电气读/写等应用。属于布鲁克纳米电学表征套件的一部分。

RETURN TO AFM MODES LIST

碳黑在橡胶基质中聚集，利用其电学性质进行区分。

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