Hysitron Accelerated Property Mapping (XPM)
Measure More in Less Time
Bruker’s XPM sets a new industry standard in terms of nanomechanical testing throughput paired with measurement resolution and accuracy. With XPM, more data can be taken in a single afternoon than could be collected in an entire year using traditional nanoindentation methodologies. These exclusive performance capabilities are made possible by the coupling of three industry-leading Hysitron technologies: a high bandwidth electrostatically actuated transducer, fast control and data acquisition electronics, and top-down in-situ SPM imaging.
Platform Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale.
XPM on the Hysitron TI 980 TriboIndenter can perform 6 nanoindentation measurements per second to achieve comprehensive quantitative nanomechanical property maps and property distribution statistics.
XPM II ultrahigh-speed property mapping, enabled by Performech III control technology, introduces trigger points and seamless switching from load to displacement control within a single experiment. XPM II on the Hysitron TI 990 TriboIndenter can reach 12 indents/second, up to 1000x faster data acquisition than traditional quasistatic nanoindentation testing.
In-Situ Microscopy Systems
Bruker’s Hysitron PI Series SEM PicoIndenters make it easy for you to conduct in-situ mechanical experiments in your electron microscope. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale. The achievable XPM rates for our most popular in-situ microscopy systems are:
