横向力显微镜（LFM）

借助接触模式成像轻松地获取摩擦信息

横向力显微镜(LFM）源自接触模式成像。在接触模式下，当悬臂梁探针在整个表面上扫描时会测量其垂向弯曲。再通过测量悬臂梁的横向弯曲，可以确定有关样品表面摩擦特性的信息。

横向力可能来自样品表面某个区域的摩擦系数的变化，也可能来自高度变化的开始。因此，LFM可用于测量表面材料的非均质性并生成具有增强的形貌特征边缘的图像。

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以二十二酸(BA）和二苯双（十八烷基氨基）溴化膦(DPOP）为原料制备的Langmuir-Blodgett单层薄膜。

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