AFM 模式

TappingMode

最热门的 AFM 成像模式，专业技术的基石

TappingMode™ 使研究人员能够对无法承受接触模式横向力的脆弱样品进行成像，并可实现远超非接触模式的较快扫描速度。

TappingMode AFM 是布鲁克的一项专利技术，通过使用振荡探针针尖轻敲表面进行形貌成像。悬臂梁的振荡幅度随样品表面形貌而变化，可通过监测这些变化并在z 反馈回路中以将变化保持在最低限度，从而获得形貌图像。

这种热门的 AFM 模式是许多高级模式的基础，如静电力显微镜(EFM)和磁力显微镜(MFM)。

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锑枝晶在石墨表面的形貌。

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