AFM 模式

扭转共振隧穿原子力显微镜(TR-TUNA)

针对脆弱样品的 TUNA 导电率成像功能

在传统的隧穿原子力显微镜(TUNA)模式下成像时，柔软或脆弱的导电样品有时会被损坏。扭转共振(TR) TUNA 为增强型选项，可通过操作扭转共振(TR) 模式代替接触模式，从而可将TUNA 用于易碎样品。这一改进大大降低了针尖作用于样品的垂直及横向力，同时确保针尖停留在便于测量 TUNA 电流的近场中—该功能对于聚合物、薄膜和纳米电子学应用尤为重要。

脆弱样品的导电率数据还可使用 PeakForce TUNA™ 模块获取，该模块将 TUNA 导电率成像和布鲁克具有突破性的 PeakForce Tapping® 模式融为一体。

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使用 TR-TUNA，对松散附着在金修饰的硅表面上的单壁碳纳米管同步进行形貌和导电率成像。

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