Join us for a webinar in two parts covering various aspects of scanning electron microscopy techniques for geological applications. Part I covers the SEM and EDS analysis while Part II covers EBSD, CL and sample preparation.
SEM combined with X-ray microanalysis (EDS) provides a very powerful tool to understand morphology and microstructure of materials. We explain how to optimize SEM and perform advanced microanalysis for geological applications. Dr. Tobias Salge, our invited guest, will review microanalysis applications in Geosciences.
This 45 min webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.
Electron BackScatter Diffraction (EBSD) and CathodoLuminescence (CL) are essential tools to complete the characterization of mineralogical samples, by understanding deformation, phase transformation, defects, crystal growth, zonation, cementation and trace element chemistry. As the techniques are surface sensitive we will also look into sample preparation methods.
This 45 min webinar will take place in September 10th and will also be round off by a 15-minute Q&A session where our experts will answer your questions. The registration for Part II will be available soon.
Dr. Laurie Palasse
Senior Application Scientist EBSD, Bruker Nano Analytics
Application Scientist, Bruker Nano Analytics
Department Manager, Hitachi High-Technologies
Sales and Applications Engineer, Hitachi High-Technologies
Dr. Toon Coenen
Product Manager, Delmic
Dr. Tobias Salge
Electron Probe Microanalyst, Natural History Museum, London