▶ Webinar Recording | 54 Minutes

On-Demand Session: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM

Techniques for nanoscale IR measurements: Photothermal AFM-IR and IR-based Scattering Scanning Nearfield Optical Microscopy.

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Presented by Cassandra Philips, Ph.D., Sales Applications Scientist, Bruker (April 05, 2020)

Featured Products and Technology

nanoIR3-s - Nanoscale Infrared Spectrometer

Anasys nanoIR3-s

Enhanced version of the nanoIR3, capable of performing s-SNOM for nanoscale electrical and optical characterization of plasmonics and photonics, and optionally available with a broadband laser

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Dimension-iconIR-Teaser-BRUKER

Dimension IconIR

Flagship photothermal AFM-IR system, offering correlative imaging modes and 150 mm of sample access for ultimate versatility in materials research and industrial R&D

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Graphic representation of AFM-IR and s-SNOM tip-surface interfaces

Comparison of AFM-IR and s-SNOM

AFM-IR and s-SNOM are complementary techniques with different strengths. With the nanoIR3-s, you can choose a configuration that has one technique or both, depending on your sample and measurement.

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nanoIR - Scattering SNOM

Scattering SNOM

Infrared scattering scanning nearfield optical microscopy

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nanoIR - Tapping AFM-IR mode

Tapping AFM-IR

The highest performance nanoscale IR chemical imaging solution

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