Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM
This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).
This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM). Both complementary modes are combined within a single instrument: Bruker’s nanoIR3-s setup. Starting with a theoretical introduction into basic principles of both techniques, this session provides an overview of key applications and basic system configuration in our demo lab in Santa Barbara, CA (US).
Speakers
Dr. Anirban Roy
Senior Applications Scientist
Cassandra Phillips
Sales Applications Scientist
