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Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM

This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).

This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM). Both complementary modes are combined within a single instrument: Bruker’s nanoIR3-s setup. Starting with a theoretical introduction into basic principles of both techniques, this session provides an overview of key applications and basic system configuration in our demo lab in Santa Barbara, CA (US).

Speakers

Dr. Anirban Roy

Senior Applications Scientist

Cassandra Phillips

Sales Applications Scientist