Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM

Techniques for nanoscale IR measurements: Photothermal AFM-IR  and IR-based Scattering Scanning Nearfield Optical Microscopy.

Understand the Fundamentals of Photothermal AFM-IR and s-SNOM

In this webinar, Bruker’s nanoscale IR experts guide the viewer through:

  • Theoretical basics AFM-IR and s-SNOM
  • Several case studies using each technique
  • An overview of basic system configuration

Webinar Summary

This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).

The presenter – Bruker expert Cassandra Phillips, Ph.D. – differentiates AFM-IR and s-SNOM by comparing them to more familiar techniques:  

  • AFM-IR is like a nanoscale FTIR
  • s-SNOM is like a nanoscale ellipsometry

Dr. Phillips delves into the fundamentals behind AFM-IR and s-SNOM. Both complementary modes are combined in Bruker’s nanoIR3-s platform.


Also included in this in-depth introductory webinar are:

  • Exemplary case studies for both AFM-IR and s-SNOM
  • System configuration descriptions, accompanied by real-machine images
  • An extensive Q&A session, where the presenter answers audience questions


In the Q&A session, viewers can expect to hear the answers to:

  • Can AFM-IR be performed in fluid?
  • What are typical sample requirements for nanoscale IR techniques?
  • What is the probing depth of the laser and that of each technique?
  • Can nanoscale IR techniques be performed using a synchrotron source? 



Find out more about the technology featured in this webinar or our other solutions for Photothermal AFM-IR and s-SNOM:


Cassandra Phillips, Ph.D.
Application Scientist, Bruker

Cassandra did her Ph.D. at the University of Toronto exploring the photophysics of boron nitride nanotubes using scattering scanning nearfield optical microscopy (s-SNOM) and computational models. She has been working at Bruker Nano Surfaces and Metrology since September 2019 as an Applications Scientist focusing on nanoscale IR spectro-microscopy and other correlated imaging techniques realized with atomic force microscopy.

Dr. Anirban Roy

Senior Applications Scientist