In this webinar, Bruker’s nanoscale IR experts guide the viewer through:
This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).
The presenter – Bruker expert Cassandra Phillips, Ph.D. – differentiates AFM-IR and s-SNOM by comparing them to more familiar techniques:
Dr. Phillips delves into the fundamentals behind AFM-IR and s-SNOM. Both complementary modes are combined in Bruker’s nanoIR3-s platform.
Find out more about the technology featured in this webinar or our other solutions for Photothermal AFM-IR and s-SNOM:
Cassandra Phillips, Ph.D.
Application Scientist, Bruker
Dr. Anirban Roy
Senior Applications Scientist