Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM

This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).

The presenter – Bruker expert Cassandra Phillips, Ph.D. – differentiates AFM-IR and s-SNOM by comparing them to more familiar techniques:  

• AFM-IR is like a nanoscale FTIR
• s-SNOM is like a nanoscale ellipsometry

Dr. Phillips delves into the fundamentals behind AFM-IR and s-SNOM. Both complementary modes are combined in Bruker’s nanoIR3-s platform.

Also included in this in-depth introductory webinar are:

• Exemplary case studies for both AFM-IR and s-SNOM
• System configuration descriptions, accompanied by real-machine images
• An extensive Q&A session, where the presenter answers audience questions

In the Q&A session, viewers can expect to hear the answers to:

• Can AFM-IR be performed in fluid?
• What are typical sample requirements for nanoscale IR techniques?
• What is the probing depth of the laser and that of each technique?
• Can nanoscale IR techniques be performed using a synchrotron source? 

Find out more about the technology featured in this webinar or our other solutions for Photothermal AFM-IR and s-SNOM: