Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices
Investigate how photothermal AFM-IR spectroscopy and imaging provide ideal solutions for advanced micro/nano-fabrication.
This webinar explains how photothermal AFM-IR spectroscopy and imaging provide ideal solutions to chemically characterize the organic contaminants, nano-patterned metal/low-k dielectrics, and directed self-assembly of block copolymers used for advanced micro/nano-fabrication.
Webinar Summary
Due to the systematic shrinking of the size of devices in the semiconductor industry, characterizing nanoscale surface contaminations in interconnects and circuitries has become a pivotal issue in test and failure analysis. Continuous development in process technology/engineering has led to the fabrication of semiconductor devices with sub-µm feature resolution, which in turn demands high-resolution analytical tools for proper characterization.
Nanoscale AFM-IR spectroscopy is a non-destructive chemical analysis method that takes advantage of the nanoscale capabilities of AFM and outputs easy-to-understand, FTIR-like spectra. As described by the presenters, the advantages of nanoscale AFM-IR can be leveraged in the semiconductor industry in many ways, like for chemical characterization of organic contaminants, nano-patterned metal/low-k dielectrics, and directed self-assembly of block copolymers.
- watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM
- watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR
- watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR
- watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM
Find out more information about Bruker's solutions for nanoIR Spectroscopy:
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Speakers
Cassandra Phillips, Ph.D.
Senior Product Manager, BrukerCassandra did her Ph.D. at the University of Toronto exploring the photophysics of boron nitride nanotubes using scattering scanning nearfield optical microscopy (s-SNOM) and computational models. She has been working at Bruker Nano Surfaces and Metrology since September 2019 as an Applications Scientist focusing on nanoscale IR spectro-microscopy and other correlated imaging techniques realized with atomic force microscopy.
Dr. Anirban Roy
Senior Applications Scientist