Bruker
製品とソリューション アプリケーション サービス ニュースとイベント キャリア 企業情報
少なくとも2文字を使用してください (現在1文字を使用しています) 。

Languages

  • Deutsch
  • English
  • Español
  • Français
  • Italiano
  • Polski
  • Português
  • Русский
  • 中文
  • 日本語
  • 한국어
▶ Webinar Recording | 54 Minutes

On-Demand Session: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM

Techniques for nanoscale IR measurements: Photothermal AFM-IR  and IR-based Scattering Scanning Nearfield Optical Microscopy.

このビデオを再生するには Cookie を受け入れる必要があります

Presented by Cassandra Philips, Ph.D., Sales Applications Scientist, Bruker (April 05, 2020)

Featured Products and Technology

nanoIR3-s - Nanoscale Infrared Spectrometer

Anasys nanoIR3-s

Enhanced version of the nanoIR3, capable of performing s-SNOM for nanoscale electrical and optical characterization of plasmonics and photonics, and optionally available with a broadband laser
詳細はこちら
  • DOWNLOAD BROCHURE
Dimension-iconIR-Teaser-BRUKER

Dimension IconIR

Flagship photothermal AFM-IR system, offering correlative imaging modes and 150 mm of sample access for ultimate versatility in materials research and industrial R&D
詳細はこちら
  • DOWNLOAD BROCHURE
Graphic representation of AFM-IR and s-SNOM tip-surface interfaces

Comparison of AFM-IR and s-SNOM

AFM-IR and s-SNOM are complementary techniques with different strengths. With the nanoIR3-s, you can choose a configuration that has one technique or both, depending on your sample and measurement.
詳細はこちら
  • REQUEST MORE INFORMATION
nanoIR - Scattering SNOM

Scattering SNOM

Infrared scattering scanning nearfield optical microscopy
詳細はこちら
  • REQUEST MORE INFORMATION
nanoIR - Tapping AFM-IR mode

Tapping AFM-IR

The highest performance nanoscale IR chemical imaging solution
詳細はこちら
  • REQUEST MORE INFORMATION
  • RETURN TO SESSION OVERVIEW
Bruker
© Copyright Bruker 2025
Imprint Terms of Use Privacy Notice Cookieに関する通知 Social Responsibility Reports