In-Situ SEM and TEM NanoTribology with Hysitron PicoIndenter
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DNA-PAINT is a localization-based super-resolution method offering molecular resolution (< 5 nm) combined with unlimited multiplexing capabilities. DNA-PAINT reagents from Massive Photonics are a perfect match for the Bruker Vutara VXL microscope. In combination with the Bruker fluidic system, automated, multiplexed cellular imaging in 3D is now accessible out of the box.
Watch the webinar for practical guidance for DNA-PAINT sample preparation, image acquisition, and data analysis, as well as an introduction to:
- The Vutara VXL super-resolution microscope and integrated fluidics unit;
- The theoretical background of DNA-PAINT; and
- The products available from Massive Photonics for DNA-PAINT experiments.
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Learn from leading experts about in-situ nanomechanical and tribological characterization — including how to quantify friction, adhesion, wear, and more
Why Seek to Understand Nanoscale Surface Changes
Tribological measurements benefit directly from in-situ techniques which shed light on deformation processes occurring at the sliding interface. In addition to enabling direct observation of wear evolution, in-situ tribology can also be used for studies of friction, tribochemical reactions, interfacial adhesion, abrasion resistance, and nanoparticle rolling.
Applications of in-situ tribology testing can include quantifying (among others):
- Scratch resistance, coefficient of friction, interfacial shear strength and adhesion of films and coatings;
- Shear forces to pillars, solder bumps, beams, MEMS devices, and oriented crystalline materials;
- Particle-substrate Interaction, friction between a single micro- or nanoparticle and the supporting substrate.
How Hysitron Picoindenter Instruments Help
Despite being applicable across a wide range of sample types and industries, until recently, in-situ nanoscale mechanical testing has been limited to the application of purely normal forces. That is, quantitative nanoindentation, compression, bending, and tensile loading coupled with direct SEM observation are accomplished by varying the tip and sample geometry. Often, however, testing in more than one dimension is required to fully understand the performance of a material system, especially when dealing with the tribological properties of a material.
In support of engineers' and researchers' growing need for increased multi-directional functionality, the nanoTribology module for Bruker's Hysitron PI 95 TEM PicoIndenter and Hysitron PI 89 SEM PicoIndenter instruments enables high-resolution measurements with simultaneous normal and lateral force/displacement sensing.
Speakers
Sanjit Bhowmick, Ph.D.
Senior Staff Scientist, Bruker
Min Zou, Ph.D., Professor, Mechanical Engineering, University of Arkansas
Tevis Jacobs, Ph.D., Professor, Swanson School of Engineering, University of Pittsburgh
