This webinar explores several case studies to illustrate how the sMIM method can be applied to a wide variety of samples such as 1D & 2D materials, ferro-electrics, dielectrics, and semiconductors.
We are pleased to invite you to join the next atomic force microscopy webinar, "Latest Advances in Scanning Microwave Impedance Microscopy," with guest speaker Nicholas Antoniou (PrimeNano, Inc.). Scanning Microwave Impedance Microscopy (sMIM) is a Scanning Probe Microscopy (SPM) method based on a near-field microwave imaging technique for the characterization of local variations in permittivity and conductivity of materials with nanoscale spatial resolution.
The presentation will include several case studies, including:
Find out more about the technology featured in this webinar or our other solutions for nanoelectrical characterization:
VP of Product Management, PrimeNano, Inc.
Ravi Chintala, Ph.D.
Application Scientist, Bruker Nano Surfaces
Peter Dewolf, Ph.D.
Application Director, Bruker Nano Surfaces