Languages
Submit the form for instant, full-length access to this session and related recordings from this event. In this session, Ian Armstrong, Ph.D. (North American Applications Manager, Bruker) discusses and demonstrates the use of automated benchtop optical profiler technology for thick film measurement.
Privacy Notice Terms of Use
* Please fill out the mandatory fields.
Note: You will be redirected to the recording after form submission. After a few moments, you should also receive an email at the address provided that contains a link to re-access the viewing page.
This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.
LIVE DEMONSTRATION: THICK FILM MEASUREMENT WITH CONTOURX-500