On-Demand Session | 25 Minutes

Measurement of the Roughness and Waviness of Thick Films and Coatings

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Submit the form for instant, full-length access to this session and related recordings from this event. In this session, Ian Armstrong, Ph.D. (North American Applications Manager, Bruker) discusses and demonstrates the use of automated benchtop optical profiler technology for thick film measurement. 


Learn how to measure the surface characteristics and thickness of films using state-of-the-art optical profilers.

  • Gain new insight into the advantages and practical limitations of optical profiler-based thick film measurement.
  • Understand how to correctly interpret and analyze optical profiler image outputs.
  • See Bruker's ContourX-500 characterize the surface topography and thickness of thick films, performed in real-time.
  • Hear experts answer audience questions about the best and most effective uses of optical profilometry for film and coating samples.


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In this demonstration, the presenter will use the ContourX-500 optical profiler to measure the film surface, then measure through the thick film to hit the substrate. The tool will then output three images that show the film thickness and the surface measurement for both. The full setup and measurement process will be shown in real-time, the output images will be shown in the presentation, and the presenter will talk about each of the images, which show the film surface, the substrate surface, and then, lastly, the thickness statistics. 

This is a great technique for if you have no steps on the film or substrate — you just have a sample that's coated in a film — because you can go anywhere on that sample and measure the top surface, then the surface underneath, and get statistics on both the surfaces and the thickness. It also works well for film islands.