In this webinar, speakers investigate the formation, evolution and failure mechanisms of the SEI layer (on patterned Si island structures) using PeakForce Tapping®, and reveal in-operando cracking of the SEI layer.
In this webinar, the presenters showcase the use of PeakForce Tapping® with its direct, pN-level force control, to obtain high-resolution images of the extremely fragile SEI layer formed on the Si anode during cycling.
The presenters explore formation, evolution, and failure mechanisms of the SEI layer on patterned Si island structures, showing in-operando cracking of the SEI layer for the first time.
These results offer guidance for strategies to tailor passivation layers, thus addressing the key issue of cycling lifetime in high-capacity Li-ion batteries.
This webinar was presented on: August 2, 2016
Find out more more the featured AFM products and services in this webinar:
Xingcheng Xiao, Ph.D.,
Staff Scientist at General Motors Global R&D Center.
Ravi Kumar, Ph.D.student,
Materials Engineering at Brown University.
Dr. Teddy Huang
Staff Development Applications Scientist, Bruker Nano Surfaces