Bruker Nano Analytics presents:

Quantification of Steels and Alloys Using a Dual Source Multidetector System - Part I: XRF-EDS and SEM-EDS Analysis

On-Demand Session - 46 Minutes

Combined Electron and X-ray Excitation for Composition Analysis

Quantification of steels and alloys can be problematic due to the various elements of interest and the range of concentrations present from majors through to traces. This two-part webinar will show the benefits of using a dual-beam system, that is, a system that has both an electron and micro-XRF source. In addition, this system is equipped with an energy dispersive spectrometer (EDS) and a wavelength dispersive spectrometer (WDS). Part I of this webinar series will focus on the dual-beam sources, and how they interact with the samples of interest to generate X-rays which are identified and quantified using EDS.  Part II will then compare these results with the measurements using the WDS collected on the same system. The samples used for this webinar are a range of steels with variable concentrations of Cr and Ni, expected for those used in industry, as well as quantifying minor and trace elements, like Co, Cu, Mn, Mo, Nb, S, and Si. In addition, results for high iron (> 95% Fe) alloys will also be presented. The results demonstrate the capabilities and benefits of using a dual source multi detector system.  

The webinar will be rounded off by a 15-minute Q&A session where our experts will answer your questions.

SEM with various micro-XRF source attached (right) with EDS (left), WDS (back) and FQ-EDS (bottom right)
Elemental intensity map of Fe and Co in various certified steels.

Who should attend?

  • Everyone dealing with an application where quantification is required
  • Researchers from industry and academia who investigate steels or alloys


Stephan Boehm

Product Manager micro-XRF on SEM and WDS, Bruker Nano Analytics

Dr. Andrew Menzies

Senior Application Scientist - Geology and Mining, Bruker Nano Analytics

Dr. Michael Abratis

Sr. Application Scientist, Bruker Nano Analytics

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