XRD beyond expectations
The D8 DISCOVER Plus is the most powerful and versatile X-ray diffractometer and the market.
Core is the high-accuracy ATLAS goniometer that hosts the high-efficiency Turbo X-ray source (TXS-HE) and the market-leading Non-Coplanar Arm.
It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.
The D8 DISCOVER Plus can be equipped with the Non-Coplanar Arm to perform In-Plane diffraction measurements with unrivalled performance.
In X-ray diffraction the base for an accurate sample analysis is the goniometer and the precise orientation of the mounted components particularly while measuring. The ATLAS goniometer exactly meets these requirements by design and sets the benchmark for angular and spatial accuracy:
The D8 DISCOVER Plus equipped with the ATLAS goniometer comes with a Bruker AXS generic alignment guarantee: the angular deviation ∆2Theta of measured and certified peak positions 2Theta is ≤0.007°. This is verified by measuring the NIST certified standard SRM1976 with each individual instrument.
Whether the key measure of an analytical X-ray tool is data quality, defined as signal-to-noise or signal-to-background, or sample throughput, one constant is that a more of signal is always an advantage.
The High Efficiency Turbo X-ray Source (TXS-HE) has been designed to boost signal while minimizing maintenance associated with rotating anode technology.
Compact UMC Plus 150
PATHFINDER Plus optics
EIGER2 R 500K
MONTEL Plus with dedicated optics
In a coplanar experiment, the source and detector increase their angle relative to the sample surface resulting in a probing direction into the sample surface.
In a non-coplanar experiment, the source and detector angle relative to the sample surface is fixed, with the detector moving in a direction parallel to the sample surface resulting in a probing direction along the sample surface.
The ATLAS goniometer increases both the angular and real space positioning accuracy of analyses allowing large scale measurements from miniature areas of the sample. A new class of diffractometer is realized by combining the symmetric divergence IµS with MONTELPlus and multimode EIGER2 R family of detectors, resulting in beam quality and detection capability similar to that found at beamlines.
Powder Diffraction (XRPD) covers a wide range of applications on samples with a low degree of orientation. The D8 DISCOVER Plus brings XRPD to a new level of precision with the ATLAS goniometer. By improving the accuracy beyond the industry leading D8 goniometer, XRPD analysis on the D8 DISCOVER Plus allows researchers to uncover minor structural details not previously observed. Equipping the D8 DISCOVER Plus with the TXS-HE allows acquisition of XRPD data over 5x faster than a conventional tube system.
Combined with the powerful DIFFRAC.SUITE software the D8 DISCOVER Plus enables the simple execution of PXRD application like:
µXRD with 2D detector
Reciprocal Space Mapping
Easy switch between point and line focus
Available anodes: Cr, Cu, Mo, Ag
Max. Power and filament: up to 3 kW (0,4 x 16 mm²), depending on anode material
Patent: EP 1 923 900 B1
Quick change of the wavelength to perfectly match different applications
Fastest switch between line and point focus for a wider range of applications and better results in shorter time
|Iµs Microfocus Source||
Power load: up to 50 W, single-phase power
MONTEL and MONTEL Plus optics combining parallel and focusing mirrors.
Beam sizes down to 180 x 180 µm².
Maximum integrated flux 8 x 10⁸ cps at mirror exit.
Beam divergence down to 0,5 mrad
Millimeter sized beam with high brilliance and ultra-low background
Green design with low power consumption, no water consumption and extended life components
Optimize the beam shape and divergence for best results
|TXS-HE X-Ray Source||
Compact and light design for vertical ATLAS goniometer
Line focus, 0.3x3 mm²
Focal Brigthness of 6 kW/mm²
Anode materials: Cu, Co, Cr, Mo
Max. voltage 50 kV, max. power depending on anode material: Cr 3.2 kW, Cu/Mo 5.4 kW, Co 2,8 kW
Pre-Aligned Tungsten filament
High flux X-ray source that allows for horizontal sample mounting.
Up to 5 times more intensity compared to standard ceramic X-ray sources.
Perfectly suited for line and spot focus applications
Pre-Aligned filament allow fast filament exchange with a minimum of re-alignment requirement.
Software push-button switch between:
Motorized Divergence Slit (Bragg-Brentano)
High Intensity Ka1,2 Parallel Beam
High Resolution Ka1 Parallel Beam
Patents: US10429326, US6665372, US7983389
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention
Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial)
Ge(220) and Ge(004) reflections in symmetric and asymmetric geometry
2-bounce and 4-bounce (Bartels type) monochromators
Alignment-free mounting through SNAP.LOCK technology
Broad choice for best resolution vs. intensity balancing to obtain best possible results.
Fast exchange of monochromators to optimize to different samples
Vertical goniometer with enforced mechanics designed to host TXS-HE X-ray source
Industry leading angular accuracy : ±0.007° 2θ guaranteed over the entire angular range determined on NIST SRM 1976
Seamless integration of D8 family of components, including optics, positioning cameras, sample stage, nonambient and detector technologies
Unparalleled accuracy and precision as manifested by Bruker's unique alignment guarantee
Absolutely maintenance free drive mechanism / gearings with lifetime lubrication
Supports the full range of applications to generate highest accuracy data
Third goniometer axis for investigating ultra-thin layers and in-plane sample properties:
Min. step size: 0.001°
Max. 2θ range (depending on the configuration): 160°
Automated detector distance detection
Unmatched accuracy with direct angular encoder
Seamless integration in DIFFRAC.SUITE software
Up to 160° 2θ range for most accurate Non-Coplanar structure determination
Real-time calibration for EIGER2 detector
|Compact UMC Stages||
Compact UMC Plus 80:
Fast spinner for XRPD
Max. (x,y) translation: +/- 40 mm
Max. sample height: 57 mm
Compact UMC Plus 150:
Max. (x,y) translation: +/- 75 mm
Max. sample height: 57 mm
Vacuum and electric feedthroughs for wafer chuck and tilt stages
Seamless switching between Thin Film research and Powder diffraction mode
5 position sample changer for 51 mm sample diameter
9 position sample changer for 32 mm sample diameter
Mapping of 2-4” wafers
Mapping of 6-8” wafers
Reflection mode 96 well plate capability
Allows for infinite Phi rotation with connected Tilt-stage and vacuum without a need to care for cables or vacuum pipe.
|Centric Eulerian Cradle (CEC)||
Five degrees of freedom sample stage:
x,y for sample translation of +/-40 mm
z-Drive for height alignment
Phi drive with 360° rotation freedom.
Psi drive and angular range from -11° to 98°
Max. weight load: 1 kg
Various stage attachment available.
Stress and Texture measurements in side-inclination mode for more accurate results.
Automated mapping capability in (x,y).
Motorized tilt-stage for precise surface alignment.
Powder- or capillary spinners allow for powder diffraction.
Bayonet sample stage holder for fast and reproducible swapping with other stages.
|Pathfinder Plus Optics||
Software push-button switch between:
2-bounce Ge Analyzer
Automated absorber integrated
Fully automatic, motorized switching between two different optics without any manual user intervention.
Maintains full field of view of LYNXEYE detectors.
Absorber ensures linearity in measured data
Energy Resolution: < 380 eV @ 8 KeV
Detection Modes: 0D,1D, 2D
Wavelengths: Cr, Co, Cu, Mo and Ag
Patents: EP1647840, EP1510811, US20200033275
No need for Kß filters and secondary monochromators
100% filtering of Fe-fluorescense with Cu radiation
Up to 450 times faster than conventional detector systems
Bragg2D: Collect 2D data with a divergent primary line beam
Unique detector warranty: No defective channels at delivery time
|EIGER2||The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd.||
Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes
Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage
Panoramic, tool-free diffracted beam optics using the complete detector field of view
Continuously variable detector positioning to balance angular coverage and resolution
Temperature: Ranging from ~12 K up to ~2500 K
Pressure: 10-⁴ mbar up to 100 bar
Humidity: 5% to 95% RH
Investigations under ambient and non-ambient conditions
Easily exchanged stages with DIFFRAC.DAVINCI
Bruker XRD solutions consist of high performance components configured to meet the analytical requirements. The modular design is the key to configure the best instrumentation.
All categories of components are part of Bruker’s key competence, developed and manufactured by Bruker AXS, or in close cooperation with third party vendors.
Bruker XRD components are available for upgrading the installed X-ray systems for improving their performance.
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