QUANTAX Compact consists of a XFlash® 730M silicon drift detector (SDD), a small electronics unit and the intuitive software ESPRIT Compact. The system performs qualitative and quantitative analyses of all materials with an element range from boron (5) to californium (98).
Besides composition analysis at individual spots on the sample surface, QUANTAX Compact provides powerful line scan and spectral element mapping functions. By using QUANTAX Compact, the analysis and reporting is completed within seconds.
High resolution data aquisition
Three different analysis modes: Objects, LineScan and Mapping
Automatic/interactive element identification starting from boron (5)
Accurate element quantification during acquisition
Display of quantitative results as atomic, weight or oxide percentage
Color-coded concentration distributions (element maps) for any number of elements within an arbitrary field of view including a unique live peak separation and background removal
Report generation and print formatting
Export of results to MS® Word and Excel
Language options: English, German, Spanish, French, Russian, Chinese, Japanese
For special solutions, please visit QUANTAX 75, QUANTAX 80 and QUANTAX Compact30.