The innovative, easy-to-use EDS system

QUANTAX Compact consists of a XFlash® 730M silicon drift detector (SDD), a small electronics unit and the intuitive software ESPRIT Compact. The system performs qualitative and quantitative analyses of all materials with an element range from boron (5) to californium (98). 

Besides composition analysis at individual spots on the sample surface, QUANTAX Compact provides powerful line scan and spectral element mapping functions. By using QUANTAX Compact, the analysis and reporting is completed within seconds.

The XFlash® 730M SD detector
ESPRIT Compact software with mapping, report, line scan, and spectrum (from left to right).

Key features

High resolution data aquisition

Three different analysis modes: Objects, LineScan and Mapping

Automatic/interactive element identification starting from boron (5)

Accurate element quantification during acquisition

Display of quantitative results as atomic, weight or oxide percentage

Color-coded concentration distributions (element maps) for any number of elements within an arbitrary field of view including a unique live peak separation and background removal

Report generation and print formatting

Export of results to MS® Word and Excel

Language options: English, German, Spanish, French, Russian, Chinese, Japanese

For special solutions, please visit QUANTAX 75, QUANTAX 80 and QUANTAX Compact30.