Academic Geoscience Research

Petrology, Geochemistry and Rock Characterization

Understanding the processes that form and transform rocks are foundational to the geological sciences. Bruker’s analytical tools empower the study of minerals, textures and spatially-resolved geochemistry from the hand sample to the sub-grain scale.

Petrologic Characterization

Petrologic Characterization

Bruker analytical tools allow characterization of geologic materials at centimeter to sub-micron scales. From stand-alone instrumentation to detectors for scanning electron microscopy, a fundamental understanding of mineralogical, textural and geochemical distributions in samples has never been more powerful. 

Mineral & Textural Characterization

Mineral & Textural Characterization

AMICS mineral map of garnet-mica schist

Accurate identification and characterization of the spatial distribution of minerals within rocks provides the basis upon which the fundamental processes of rock formation are understood. Depending on the task, characterization may be needed on hand sample, single-grain, and sub-grain scales, and with the need to correlate mineral chemistry with textural relationships. Bruker products cross these scales and data needs with products such as:

  • M4 TORNADO and M4 TORNADOPLUS allow rapid mapping of minimally prepared samples allowing determination of mineral species and textural distributions in solid and granulated samples, with mineral chemistry measured down to ppm levels 

  • QUANTAX detectors for scanning electron microscopes, including EDS, WDS and EBSD, providing comprehensive structural and compositional data on any solid sample to sub-micron scales

  • AMICS automated mineralogy solution for scanning electron microscopes and micro-XRF, driving rapid mineral identification and characterization for wide ranging applications in geoscience and geological engineering 

  • D2 PHASER, D8 DISCOVER and D8 ADVANCE range of X-ray Diffraction solutions covering all applications and needs from compact, benchtop instruments to high-resolution single-crystal characterization.

  • SKYSCAN 1275 and SKYSCAN 1273 X-ray microscopes enable visualization and quantification of the 3D mineral distribution in solid and granulated samples

Spatially Resolved Geochemistry

Spatially Resolved Geochemistry at the Hand-sample Scale by Micro-XRF

M4 TORNADO µXRF map of a c. 3.0 Ga stromatolite; field of view is 60 cm across

Visualization of major, minor and trace elements in a rock underpin our understanding of many geologic processes.  Typically confined to the scale of thin sections or below, rapid characterization of geochemical zoning in larger samples provides additional context to further investigation, allowing more robust sub-sampling decisions for other analytical approaches, and potentially reducing the total number of samples analyzed by more expensive techniques. Bruker products that allow visualization of geochemistry include:  

  • M4 TORNADO micro-XRF providing geochemical mapping of large samples and detection down to 10's of ppm, leading to accurate characterization of geochemical distribution in any solid sample, and quantification of bulk geochemistry through integration of map data. 

  • M4 TORNADOPLUS is a micro-XRF optimized for enhanced light element detection, with large-area light element SDD detectors and capability for analysis under vacuum and a He atmosphere, allowing element detection down to C. 

  • XTrace–QUANTAX micro-XRF, which upgrades an SEM to allow trace element analysis on the same instrument. High-speed mapping using XTrace is possible when coupled with the Rapid Stage, a modular piezo-based system that mounts directly onto a standard SEM stage. 

Bulk-rock Geochemistry

Bulk-rock Geochemistry by ED-XRF and WD-XRF

Whole-rock geochemistry is an integral component of research into geologic processes, where accurate major, minor and trace element chemistry is a must. Bruker provides a full range of Energy Dispersive and Wave Dispersive XRF solutions that suit every application and analytical need.

  • TRACER handheld-XRF and CTX portable benchtop ED-XRF instruments provide portable and compact solutions at affordable budgets while not compromising on performance 

  • S2 PUMA high capacity benchtop ED-XRF units can analyze from C to Am, with sample changer systems holding up to 20 samples

  • S6 JAGUAR compact WD-XRF provide high-performance bulk geochemical performance in a compact format, while the S8 TIGER sequential WD-XRF allows major and trace element analyses in a single run. 

Petrochronology

Petrochronology

AMICS Image of accessory minerals over BSE underlay

Advances in our understanding of geologic processes have demonstrated the need for, and benefits derived from, knowing the textural context of dateable minerals in rocks. Commonly the minerals used for geochronology are accessories – fine-grained and low abundance – leading to significant effort and resources expended on locating them in thin sections or mineral separates. Micro-XRF and SEM-based automated mineralogy solutions can speed up this process, correctly identifying minerals and placing them in their textural-mineralogical context. 

  • M4 TORNADO micro-XRF allows geochemical mapping of large samples providing mineral distributions by geochemical proxy or directly through application of Bruker's AMICS automated mineralogy solution

  • AMICS for scanning electron microscopes provides automated mineralogical mapping of thin sections and polished grain mounts, with focused detection of key minerals and compositional quantification for robust classification

Vibrational Spectroscopy

Vibrational Spectroscopy

MicroRaman spectroscopy

Point analysis and mapping of mineral structure and composition, discriminating polymorphs or chemically similar but structurally different minerals, with spectral reference libraries allowing rapid and routine characterization and OPUS™ software optimizing spectral matching. 

FT-IR Spectroscopy

Chemical structure at the molecular scale where elemental data alone is insufficient, including organic matter characterization, prosody and permeability studies, analysis of glasses, fluid and melt inclusions. 

Más información

Webinars on Petrology, Geochemistry and Rock Characterization

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July 8, 2020

Seeing the world through other eyes

Scanning micro-XRF has developed into a highly informative analytical tool for the study of complex samples across multiple disciplines.
Multiscale in-situ non-destructive micro-XRF scanning analysis
May 19, 2020

Multiscale in-situ non-destructive micro-XRF scanning analysis

The micro-analysis of geological samples is common practice to obtain valuable information, for example in mineral exploration and process mineralogy.
The annular SDD XFlash® FlatQUAD is ideally suited for the analysis of topographically complex, three-dimensional and beam sensitive samples.
May 28, 2020

Fast, Accurate and Precise Quantification Results Using an Annular Silicon Drift Detector: Bruker’s XFlash FlatQUAD

The annular SDD XFlash® FlatQUAD is ideally suited for the analysis of topographically complex, three-dimensional and beam sensitive samples.
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September 4, 2018

Advanced Data Mining in Micro-XRF

In this webinar we will focus on 3 examples on how to get data out of a Hypermap data cube using different software features.
Analytical SEM Solutions for Geology - Part I
August 13, 2019

Analytical SEM Solutions for Geology - Part I

Join us for a webinar in two parts covering various aspects of scanning electron microscopy techniques (EDS, EBSD, CL) for geological applications.
The techniques are surface sensitive
September 10, 2019

Analytical SEM Solutions for Geology - Part II

Join the second part of this free webinar dealing with scanning electron microscopy techniques (EBSD, CL) for geological applications.
Bruker's M4 TORNADO is a tabletop Micro-XRF spectrometer.
May 16, 2019

Explore Micro-XRF in the Geosciences

Explore the exciting world of micro-XRF for Geology and get questions on the method answered by leading Micro-XRF experts.
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April 25, 2019

Advanced Element Analysis of Geological Samples using QUANTAX WDS for SEM

Advantages of WDS for SEM for the analyses of geological samples.
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March 14, 2019

Large Area High Resolution Maps of Geological Samples

In this webinar we present Hypermap analyses of geological samples relevant to various applications, e.g. economic geology, mineralogy etc.
Infrared and Raman Analysis of Geological Samples
November 9, 2018

Infrared and Raman Analysis of Geological Samples

Should I Lick my Crystal?
June 22, 2017

Should I Lick my Crystal?

Mineral identification in 5 minutes.
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June 15, 2017

Latest advances in identifying mineral composition variation by the M4 TORNADO AMICS

The new M4 TORNADOAMICS spectrometer allows the creation of mineral maps from spatially resolved X-ray Fluorescence (XRF) signals.
AMICS
Dec 15, 2016

AMICS — The Latest Software Package for Automated Identification and Quantification of Minerals and Synthetic Phases

The Advanced Mineral Identification and Characterization System (AMICS) is the latest software package for automated identification and quantification of minerals and synthetic phases. The key of this package lies in its innovative imaging and analysis software capabilities.

Productos relacionados

Products for Petrology, Geochemistry and Rock Characterization

Captura de pantalla de AMICS

Sistema Automatizado de Mineralogía AMICS para SEM

Escaneo rápido automatizado para la caracterización de minerales y rocas por SEM
D8 AVANCE

Familia D8 ADVANCE

La familia D8 ADVANCE es un sistema modular totalmente extensible que aborda las necesidades analíticas de muestras de polvo, a granel y película delgada, en condiciones ambientales y no ambientales.
D8 ENDEAVOR

D8 ENDEAVOR

El nuevo D8 ENDEAVOR es un avanzado sistema de difracción de rayos X (XRD) para aplicaciones de polvo en la optimización de procesos industriales y control de calidad. El sistema se puede utilizar solo en un entorno multiusuario o integrarse en un entorno de laboratorio para un funcionamiento totalmente automatizado.
D2 PHASER

D2 PHASER

El mejor difractómetro de sobremesa del mundo. XRD para todos XRD para todas partes XRD para todo
Microscopio FT-IR de investigación: HYPERION

Microscopio FT-IR de investigación: HYPERION

Microscopía infrarroja en el límite físico de la difracción de la luz. Este microscopio IR modular sirve tanto a científicos como a investigadores.
Microscopio FT-IR: LUMOS II

Microscopio FT-IR: LUMOS II

Dedicado a un análisis microquímico rápido y fácil e imágenes ultrarrápida. Ideal para análisis de fallos, análisis de partículas y resolución de problemas de control de calidad.
Espectrómetro micro-XRF M4 TORNADO

M4 TORNADO

Micro-XRF de alto rendimiento para punto pequeño (<20 µm) y análisis multicapa (12 seleccionables) incluido mapeo de distribución de composición y elementos (escaneo de área en 2D)
M4 TORNADO AMICS

M4 TORNADO AMICS

M4 TORNADO AMICS constituye un nuevo e innovador enfoque de la mineralogía automatizada que utiliza la excitación de rayos X para recoger espectros de energía para la identificación de minerales.
Espectrómetro micro-XRF M4 TORNADO PLUS

M4 TORNADO PLUS

El revolucionario escáner micro-XRF para elemento súper ligeros
Microscopio Raman Confocal SENTERRA II

Microscopio Raman Confocal SENTERRA II

El punto de referencia μ-Raman en comodidad, seguridad y precisión de uso. Una herramienta impulsada por resultados para un análisis microquímico Raman 100% fiable.
SKYSCAN 1273

SKYSCAN 1273

Benchtop 3D X-ray microscope requires minimum lab space, is easy to start running, and offers high system uptime with low cost of ownership.
SKYSCAN 2214

SKYSCAN 2214

Floor standing nano-XRM with high power source, advanced vibration isolation and multiple detectors providing highest versatility.
Detector eFlash HD EBSD

QUANTAX EBSD

El sistema QUANTAX EBSD con su popular cabezal detector OPTIMUS TKD es la mejor solución disponible para analizar nanomateriales en el SEM
Espectrómetro XFlash 6/30 EDS

QUANTAX EDS para SEM

Los EDS más avanzados para su SEM, FIB y EPMA
Fuente de rayos X de micropunto XTrace

QUANTAX Micro-XRF

Sensibilidad altamente elemental con preparación mínima de muestras
Espectrómetro XSense WDS

QUANTAX WDS

Instrumento de alta precisión para microanálisis de rayos X ultrasensible y de alta resolución en el rango de baja energía.