Brilliant Visuals. Ultrafast Imaging.
More space for sample preparation. More speed for chemical imaging. More perfomance in ATR, transmission and reflection microscopy. This is what we call a true game changer - no discussion.
LUMOS II technical features:
LUMOS II provides:
We believe that it is high time to make advanced techniques available to every user, regardless of their skill level. The benefits of FT-IR imaging and microscopy are too great to restrict access by cumbersome hard- and software.
From the start the LUMOS II was meant to make FT-IR imaging faster, easier, more accurate and reliable – and even more fun. Of course, this required us to include new and improve upon proven technology.
That's why we tailored the LUMOS II, its software and user interface specifically to the user. Beginners get perfect results in no time, while experts maintain total instrument control.
It comes down to this: Better instrument. Better results.
Whether it is transmission, reflection or attenuated total reflectance (ATR), the LUMOS II is always the right choice. But its greatest strength is ATR microscopy enhanced by FPA technology. This makes the LUMOS II a universal tool for failure analysis and product development.
To cut a long story short, its ATR capabilities are unsurpassed. Period. Don‘t settle for unreliable, manual ATR accessories – get the best. Get the LUMOS.
The retractable crystal is controlled by high precision piezoelectrical motors and integrated into the lens. This allows you to enjoy a clear view of the sample while your measurement still takes place exactly where you want it.
Endurance and power for your applications.
For us it is a natural thing to pass on the best technology to our customers. Of course, this also applies to the LUMOS II.
The RockSolidTM interferometer guarantees constant performance, while modern electronics ensure mechanical precision and low energy consumption. Meanwhile, the software monitors instrument effectiveness and always ensures correct functionality.
Particle & Surface Analysis
Polymers and Plastics
Art and Restoration
New Feature: High Performance Chemical Image Generation by New Adaptive K-means Clustering Function
This new function is the logical next development step for our well known Cluster analysis function.The Adaptive K-means Clustering Function is based on a new algorithm, which enables a non-supervised and autonomous determination of spectral variance within your imaging or mapping results.
New Feature: “Cluster ID” Function for Identification of Classes in 3D Spectral Data
Our new Cluster ID function enables the identification of clusters within imaging and mapping data using the OPUS functions: spectrum search in libraries, quick compare, or identity test.
Updated Feature: "Find Particles" function now contains a novel particle detection method
The proven "Find Particle" software can now be applied to both: the visual and the IR image. With this updated feature, you are able to do particle detection based on chemical images that were measured by the LUMOS II.
Learn more about our FT-IR microscopes and solutions by downloading related literature.