FT-IR Microscope

LUMOS II

The LUMOS II is a stand-alone FT-IR microscope that excels in failure analysis, material research and particle analysis. It is compact, precise and features ultrafast chemical imaging by FPA technology.

Exceptional IR.

Brilliant Visuals. Ultrafast Imaging.

Banner LUMOS II

Highlights

Easy effective precise

The FT-IR Microscopy and Imaging Powerhouse

Inroduction of the LUMOS II | Product Presentation
The LUMOS II product manager presents the LUMOS II and its features.
Our Statement

Infrared Microscopy the way it was meant to be.

More space for sample preparation. More speed for chemical imaging. More perfomance in ATR, transmission and reflection microscopy. This is what we call a true game changer - no discussion.

Features

Features

LUMOS II technical features:

  • Standard TE-MCT detector
  • Plug & Play: no liquid nitrogen, no dry-air purge
  • Optional FPA-imaging detector
  • Novel PermaSure+ calibration technology
  • Fully motorized and automated hardware
  • Accomodates samples of up to 40 mm in height
  • Long lifetime of components including laser
  • Inert to high humidity (ZnSe Optics)
  • Stand-alone design, small footprint
  • Low power consumption
 

LUMOS II provides:

  • Ease-of-use by software guided measurements
  • High-definition spectral and visual data
  • High IR sensitivity without liquid nitrogen
  • Visual resolution in the sub micrometer range 
  • Ultrafast FPA imaging performance
  • FPA imaging ATR/transmission/reflection
  • Easy access to the sample stage
  • Compliance to cGMP and FDA 21 CFR p11
  • Automated OQ/PQ/pharmacopeia tests
  • Anytime upgradeability
 

Applications

  • Failure analysis
  • Particle & surface analysis
  • Industrial manufacturing
  • Forensical science
  • Life science
  • Polymers & plastics
  • Environmental science
  • Pharmaceuticals
What is the LUMOS II

The Anywhere / Anyone FTIR Microscope

We believe that it is high time to make advanced techniques available to every user, regardless of their skill level. The benefits of FT-IR imaging and microscopy are too great to restrict access by cumbersome hard- and software.

From the start the LUMOS II was meant to make FT-IR imaging faster, easier, more accurate and reliable – and even more fun. Of course, this required us to include new and improve upon proven technology.

That's why we tailored the LUMOS II, its software and user interface specifically to the user. Beginners get perfect results in no time, while experts maintain total instrument control.

EXCELLENT FT-IR MICROSCOPY

Superior µ-ATR FT-IR Capabilities

It comes down to this: Better instrument. Better results.

Whether it is transmission, reflection or attenuated total reflectance (ATR), the LUMOS II is always the right choice. But its greatest strength is ATR microscopy enhanced by FPA technology. This makes the LUMOS II a universal tool for failure analysis and product development.

To cut a long story short, its ATR capabilities are unsurpassed. Period. Don‘t settle for unreliable, manual ATR accessories – get the best. Get the LUMOS.

The retractable crystal is controlled by high precision piezoelectrical motors and integrated into the lens. This allows you to enjoy a clear view of the sample while your measurement still takes place exactly where you want it.

Proven Technology

Convincing Innovation

Endurance and power for applications.

For us it is a natural thing to pass on the best technology to our customers. Of course, this also applies to the LUMOS II.

The RockSolidTM interferometer guarantees constant performance, while modern electronics ensure mechanical precision and low energy consumption. Meanwhile, the software monitors instrument effectiveness and always ensures correct functionality.

Applications

LUMOS II Application Videos

Coating defect analysis by ATR-FT-IR microscopy.
PCB failure analysis by FT-IR microscopy.
Textile and fleece quality control by FT-IR microscopy.
Diamond gemstone analysis by FT-IR microscopy.
Particle root cause analysis performed by IR microscopy.
Multi-layer film and laminate analysis by macro ATR imaging.
Coating thickness analysis of DLC layers by FT-IR microscopy.
Composite multi-layer polymers analyzed by ATR-FT-IR.

Testimonials

Testimonial: Microplastics

The team led by Dr. Martin Löder and Prof. Christian Laforsch maintains one of the leading microplastics analysis laboratories in Germany.

News & Events

OPUS Release 8.7  | LUMOS II | Q3 2021

New Feature: High Performance Chemical Image Generation by New Adaptive K-means Clustering Function

This new function is the logical next development step for our well known Cluster analysis function.The Adaptive K-means Clustering Function is based on a new algorithm, which enables a non-supervised and autonomous determination of spectral variance within your imaging or mapping results.

  •  Forecasting or time consuming searching of the included amount of chemical classes is no longer been necessary as the algorithm can predict all included chemical classes  by itself.
  • This major function is important for all kind of chemical imaging and distribution analysis of unknown samples or small structures within larger datasets.
  • Together with the LUMOS II analysis and evaluation is as easy as possible and safes your valuable time and nerves.

New Feature: “Cluster ID” Function for Identification of Classes in 3D Spectral Data

Our new Cluster ID function enables the identification of clusters within imaging and mapping data using the OPUS functions: spectrum search in libraries, quick compare, or identity test.

  • Easy determination of the chemical identity of classified sample components for particles, layers in laminates, components of pharmaceutical tablets and other inhomogeneous materials.
  • Reliable and comprehensive statistics reports about quantity, size and of course identity of all analyzed structures is provided and leads particle and technical cleanliness analysis to a new, autonomous level.

Updated Feature: "Find Particles" function now contains a novel particle detection method

The proven "Find Particle" software can now be applied to both: the visual and the IR image. With this updated feature, you are able to do particle detection based on chemical images that were measured by the LUMOS II.

  • While particle recognition for low contrast structures and off-white/transparent particles/fibers on off-white filter membranes can be tedious, a postrun particle determination based on the chemical IR image allows you to determine quantity and size of particles from your imaging or mapping results.
  • With the Find Particle Function together with the LUMOS II you will never miss any detail – neither in visual nor in IR range.
Fully automatically created chemical images by the new adaptive k-means clustering function.
Automatically recognized particles on an aluminum oxide filter. Particles are immediately classified by size and identity with the new "Cluster ID".

More Information

FT-IR Microscopes Literature Room

Learn more about our FT-IR microscopes and solutions by downloading related literature.