OPUS: Último lanzamiento

• Support of the instruments VERTEX NEO, VERTEX and MPA by the new OVP: These instruments have been transferred to the new validation program OVP-X for simple comprehensive and reliable instrument qualification.
  

• New Graphical User Interface (GUI): The GUI is modernized with ribbons as it is well-known from Microsoft Office.
  Getting started with OPUS is made easier for new users because the GUI follows the philosophy of Microsoft Office.
  Customers who have worked with the previous user interface will quickly find their way around because the icons are unchanged.
  BRUKER Optics has taken the opportunity to review the allocation of all functions, grouped them and assigned some to more suitable menus.
  The HOME menu gives the user quick access to all essential and frequently used functions. As usual, the views differ depending on the selected workspace.

New Graphical Method Editor in the Rapid Scan Time Resolved Measurement Dialog: The “Method Editor” tab of the “Rapid Scan Time Resolved Measurement” dialog has been extended by a graphical representation of the TRS-method. The method is shown as a sequence of graphical blocks, each block standing for a command/line in the method.
Blocks can be inserted into the method, moved to another position or deleted, by mouse-drag and drop. Command parameters are entered or edited via specific user controls on each block. The familiar text representation is still available.

• Autonomous Composition Identifier Software: Composition-AID: Chemical composition identification of samples based on their IR or Raman spectral data. A multi-step artificial intelligence algorithm determines the best match for the query spectrum using reference spectral databases.
  The algorithm automatically evaluates results for pure substances as well as complex mixtures without requiring any input from the user. For the recommended and possible alternative results, a composite from the weighted component spectra and its difference to the sample spectrum is calculated.

Highlights of Composition-AID:

• Best match recommendation for optimal balance of reliability and sensitivity
• Extensive hit quality diagnostics:
  o    difference spectrum between composite and query spectrum (=residual)
  o    graph of hit quality and unexplained peaks plotted against component number
• High performance – comprehensive multi-component analysis in seconds
• Interactive report generation of single and multiple alternative results
  

• Particle Identification: It combines capabilities of OPUS functions “Find Particles” and “Cluster ID” to ease the workflow for detection and identification of particles from IR and Raman images. The new function allows to detect particles in IR and Raman chemical images and determine their dimensions and identity in a single evaluation step.

• Particle Statistics: The tool is for examining results from IR and Raman particle analysis by filtering and graphically displaying the data according to attributes like dimension, identity and hit quality.

• Microplastic Classification: The microplastic classification function is a machine-learning based classifier that determines the identity and dimensions of microplastics particles that have been measured by FT-IR imaging (i.e. with LUMOS II-IMG). The classifier has been trained on reference data which has been recorded on aluminum oxide (“Anodisc”) filters.

• Anodisc surface model: The visual quality of microscopic overview images is optimized for uneven aluminum oxide (“Anodisc”) filter surfaces. The surfaces of Anodisc filters, which are a commonly used substrate in microplastics analysis can show some unevenness of the surface. The “Anodisc surface model” function determines this variation in the filter topology and generates a model for focus correction during visual image generation, resulting of higher sharpness of the entire field of view. The improved visual image quality allows a better correlation of the visual and IR image. Furthermore, a better detection of particles based on the visual image for single point analysis is achieved.

• Flat-plane interpolation for overview images: It is used for optimization of the visual quality of microscopic overview images of tilted sample surfaces. The “Flat-plane interpolation” function determines the tilt of flat sample surfaces which are not perfectly levelled. The focus is corrected accordingly during visual image generation, resulting in a higher sharpness of the entire field of view.

• 3D Quick Compare: Evaluation of 3D spectral data by using the OPUS Quick Compare methods. IR and Raman images are generated by correlation of pixel spectra with known reference spectra. A user-defined threshold sets the minimum correlation coefficient needed for identifying or verifying the presence of the reference components.

• Co-local-measurement: Analysis of identical region of interest on microscopic samples using both Raman and IR microscopy. The “Co-local measurement” function allows to transfer the overview image and the measurement area between LUMOS II, HYPERION II and SENTERRA II. This makes the analysis of the identical region of interest possible, using both the IR and Raman technology.

Las nuevas funciones del Raman portátil BRAVO incluyen:

• Acceso Web BRAVO
  Una interfaz https segura permite acceder a la información del sistema, la funcionalidad de licencia, la gestión de certificados EAP-TLS y la funcionalidad de compartir pantalla BRAVO.
• Visor BRAVO
  
  El acceso web https seguro permite compartir la pantalla del BRAVO, así como el control remoto total del software BRAVO a través de un navegador web.
• Diagnóstico del dispositivo
  
  Funcionalidad de diagnóstico del dispositivo actualizada para un acceso rápido y sencillo a la información del estado de rendimiento.
• Autenticación WiFi EAP-TLS
  Soporte de protocolo EAP-TLS con certificados personalizados.
• Modo de Servicio
  
  Nueva funcionalidad del modo de servicio para permitir un mantenimiento completo por parte del servicio Bruker.
• Conexión al servidor de tiempo NTP
  
  Una nueva opción para controlar la fecha y hora del sistema es la conexión independiente a un servidor de hora NTP.
  
  

Las nuevas funciones ONET 3.1 incluyen:

• Nueva y moderna interfaz web de usuario
• Comunicación con clientes ONET más rápida y eficiente
  

• Fácil asignación de valores de referencia mediante la importación de .csv

Las nuevas funciones de CMET 3.1 incluyen:

BIAS en línea, control de recetas (manejo simplificado para procesos por lotes) y CMET como servicio.

Soporte de los cabezales de emisión de la serie Q412 y modo adicional de única fuente.

Gráfico de tendencias con una nueva interfaz, funcionalidad de inicio de sesión y conexión a la base de datos.