OPUS: Latest Release

• Support of the instruments VERTEX NEO, VERTEX and MPA by the new OVP: These instruments have been transferred to the new validation program OVP-X for simple comprehensive and reliable instrument qualification.

• New Graphical User Interface (GUI):
  The GUI is modernized with ribbons as it is well-known from Microsoft Office. Getting started with OPUS is made easier for new users because the GUI follows the philosophy of Microsoft Office.
  
  Customers who have worked with the previous user interface will quickly find their way around because the icons are unchanged, we took the opportunity to review the allocation of all functions, grouped them and assigned some to more suitable menus.
  
  The HOME menu gives the user quick access to all essential and frequently used functions. As usual, the views differ depending on the selected workspace.

• New Graphical Method Editor in the Rapid Scan Time Resolved Measurement Dialog: The “Method Editor” tab of the “Rapid Scan Time Resolved Measurement” dialog has been extended by a graphical representation of the TRS-method. The method is shown as a sequence of graphical blocks, each block standing for a command/line in the method.
  Blocks can be inserted into the method, moved to another position or deleted, by mouse-drag and drop. Command parameters are entered or edited via specific user controls on each block. The familiar text representation is still available.

• Autonomous Composition Identifier Software: Composition-AID: Chemical composition identification of samples based on their IR or Raman spectral data. A multi-step artificial intelligence algorithm determines the best match for the query spectrum using reference spectral databases.
  The algorithm automatically evaluates results for pure substances as well as complex mixtures without requiring any input from the user. For the recommended and possible alternative results, a composite from the weighted component spectra and its difference to the sample spectrum is calculated.

Highlights of Composition-AID:

• Best match recommendation for optimal balance of reliability and sensitivity
• Extensive hit quality diagnostics:
  o    difference spectrum between composite and query spectrum (=residual)
  o    graph of hit quality and unexplained peaks plotted against component number
• High performance – comprehensive multi-component analysis in seconds
• Interactive report generation of single and multiple alternative results
  

• Particle Identification: It combines capabilities of OPUS functions “Find Particles” and “Cluster ID” to ease the workflow for detection and identification of particles from IR and Raman images. The new function allows to detect particles in IR and Raman chemical images and determine their dimensions and identity in a single evaluation step.

• Particle Statistics: The tool is for examining results from IR and Raman particle analysis by filtering and graphically displaying the data according to attributes like dimension, identity and hit quality.

• Microplastic Classification: The microplastic classification function is a machine-learning based classifier that determines the identity and dimensions of microplastics particles that have been measured by FT-IR imaging (i.e. with LUMOS II-IMG). The classifier has been trained on reference data which has been recorded on aluminum oxide (“Anodisc”) filters.

• Anodisc surface model: The visual quality of microscopic overview images is optimized for uneven aluminum oxide (“Anodisc”) filter surfaces. The surfaces of Anodisc filters, which are a commonly used substrate in microplastics analysis can show some unevenness of the surface. The “Anodisc surface model” function determines this variation in the filter topology and generates a model for focus correction during visual image generation, resulting of higher sharpness of the entire field of view. The improved visual image quality allows a better correlation of the visual and IR image. Furthermore, a better detection of particles based on the visual image for single point analysis is achieved.

• Flat-plane interpolation for overview images: It is used for optimization of the visual quality of microscopic overview images of tilted sample surfaces. The “Flat-plane interpolation” function determines the tilt of flat sample surfaces which are not perfectly levelled. The focus is corrected accordingly during visual image generation, resulting in a higher sharpness of the entire field of view.

• 3D Quick Compare: Evaluation of 3D spectral data by using the OPUS Quick Compare methods. IR and Raman images are generated by correlation of pixel spectra with known reference spectra. A user-defined threshold sets the minimum correlation coefficient needed for identifying or verifying the presence of the reference components.

• Co-local-measurement: Analysis of identical region of interest on microscopic samples using both Raman and IR microscopy. The “Co-local measurement” function allows to transfer the overview image and the measurement area between LUMOS II, HYPERION II and SENTERRA II. This makes the analysis of the identical region of interest possible, using both the IR and Raman technology.

All the features at one glance

• Autonomous Composition Identifier, or A.I.D.
• Product Measurement Workflow
• Trend View
• ONet Client Functionality
• The Tutorial Center

Autonomous Composition Identifier, or A.I.D.

Fast and reliable analysis function for complex mixtures and pure substances. The new Composition-ID function is a completely new designed spectra search tool for mixtures and pure components. It requires no input for the expected number of components, provides a multitude of results in one run and automatically selects the one that fits best.   

Product Measurement Workflow

The product measurement workflow enables fast and efficient measurement and evaluation of various samples. Each product precisely defines the measurement and evaluation process and can include an image to facilitate easy navigation within the workflow. Individual products can also be added directly to the home screen for quick access. The result view consolidates multiple results and visually highlights predefined warning and alarm limits for better clarity and decision-making. 

Trend View

The trend view enables the visualization of various result types obtained from product measurements, including Quant 1, Quant 2, and Quick Compare. Outliers, such as those exceeding warning or alarm limits, are clearly highlighted graphically. Users can select different time ranges for analysis and export results in CSV format.

ONet Client Functionality

OPUS TOUCH can serve as an ONet client for ONet 4.0, enabling centralized setup, administration, and control of a network of FTIR instruments from any remote location worldwide.

• Data Exchange: Products can be received from the ONet server, and spectra and results can be uploaded back to it. This integration ensures streamlined operations, robust data access, and efficient instrument network management.
• Local Accessibility: All data and required files remain available locally, allowing for uninterrupted sample analysis even during network downtime.
• User Management: User rights are managed via ONet, with fine-tuning possible directly on the client.
• Monitoring: ONet receives status updates and PQ/OQ reports from connected clients.

The Tutorial Center

The tutorial center, accessible via a new icon in the upper-right corner of the screen, offers a library of video tutorials covering a wide range of TOUCH functions. Context-specific videos are displayed based on the currently active view, ensuring relevant guidance. All tutorials include both audio and subtitles, providing a user-friendly and accessible learning experience.

New BRAVO handheld Raman features include:

• BRAVO Web Access: A secure https interface enables to access system information, licensing functionality, EAP-TLS certificate management and a BRAVO screen sharing functionality.
• BRAVO Viewer: The secure https web access enables screen sharing of the BRAVO GUI as well as full remote control of the BRAVO software via a web browser.
• Device Diagnostics: Updated device diagnostics functionality for fast and easy access to performance status information.
• EAP-TLS WiFi Authentication: Support of EAP-TLS protocol with custom certificates.
• Service Mode: New service mode functionality to enable flawless maintenance by Bruker service.
• NTP time server connection: A new option for controlling the system date & time is the stand-alone connection to a NTP time server.
  
  
  

New ONET 3.1 features include:

• New, modern Web User Interface
• Faster and more efficient communication with ONET clients
  

• Easy assignment of reference values via .csv import.

New CMET 3.1 features include:

• Online BIAS, recipe control (simplified handling for batch processes) and CMET as a Service.
• Emission Head Q412-series and its additional single-source mode is supported.
• Trend Chart with a new interface, login functionality and database connection.