Analytical SEM Solutions for Geology

Analytical SEM Solutions for Geology - Part I

This webinar took place on August 13th 2019

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Overview

Join us for a webinar in two parts covering various aspects of scanning electron microscopy techniques for geological applications. Part I covers the SEM and EDS analysis while Part II covers EBSD, CL and sample preparation.

Part I - Geological Scanning Electron Microscopy (SEM) for Imaging and Compositional Analysis

SEM combined with X-ray microanalysis (EDS) provides a very powerful tool to understand morphology and microstructure of materials. We explain how to optimize SEM and perform advanced microanalysis for geological applications. Dr. Tobias Salge, our invited guest, will review microanalysis applications in Geosciences.

This 45 min webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.

Part II - Exploring Microstructure and Chemistry in Minerals using EBSD and CL

Electron BackScatter Diffraction (EBSD) and CathodoLuminescence (CL) are essential tools to complete the characterization of mineralogical samples, by understanding deformation, phase transformation, defects, crystal growth, zonation, cementation and trace element chemistry. As the techniques are surface sensitive we will also look into sample preparation methods.

This 45 min webinar will take place in September 10th and will also be round off by a 15-minute Q&A session where our experts will answer your questions. The registration for Part II will be available soon.

Who should attend?

  • Researchers in geological sciences and mining
  • Microscopists wanting to explore new analytical techniques like EBSD and CL
  • Anyone considering electron microscopy as a characterization technique for ceramics, oxide materials, minerals and similar
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Speakers

Dr. Laurie Palasse
Senior Application Scientist EBSD, Bruker Nano Analytics
Max Patzschke
Max Patzschke
Application Scientist, Bruker Nano Analytics
Mats Eriksson
Department Manager, Hitachi High-Technologies
Sten Sturefelt
Sales and Applications Engineer, Hitachi High-Technologies
Dr. Toon Coenen
Product Manager, Delmic
Dr. Tobias Salge
Electron Probe Microanalyst, Natural History Museum, London