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Webinar Recording: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Characterizing nanometer-scale features in semiconductor devices using nanoIR spectroscopy

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Presented by Cassandra Phillips, Ph.D., Sales Applications Scientist, Bruker; and Anirban Roy, Dr., Senior Application Scientist, Bruker

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Flagship photothermal AFM-IR system, offering correlative imaging modes and 150 mm of sample access for ultimate versatility in materials research and industrial R&D

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