This webinar focuses on the use of the Dimension IconIR AFM-IR platform — especially for co-localized imaging — and features expert-led presentations and demonstrations of the system.
The Dimension IconIR combines Bruker’s industry-leading nanoIR™ photothermal AFM-IR technology with the large-sample Dimension Icon® AFM platform to establish new standards in chemical and material property mapping with sub-10nm chemical imaging resolution and correlative microscopy.
During this virtual workshop, we will introduce photothermal AFM-IR spectroscopy on Bruker’s newest AFM-IR product, including discussion of applications and co-localized imaging with Photothermal AFM-IR and PeakForce property mapping modes.
Presentations by the nanoIR team will be interspersed with live demonstrations of sample measurement with the Dimension IconIR with multiple co-local datasets.
Find out more about the technology featured in this webinar or our other solutions for nanoscale chemical and mechanical property mapping: