Bruker Nano Analytics Presents:

Industrial Applications of micro-XRF

On-Demand Session - 50 minutes

Quality Control and Foreign Body Indentification for Industrial Processes

Micro-XRF as an analytical technique has a wide range of possible applications, but it is often considered to be most suitable for research labs and academic environments. This sentiment is needlessly restrictive – micro-XRF can be applied just as well across multiple stages of industrial processes.

For the materials testing of incoming goods - a task where bulk XRF is well-established - micro-XRF can go one step beyond precise quantitative analysis by also revealing component level alterations, be they accidental or intentional.

While true in-line analysis of products remains a very challenging task, investigating individual conspicuous components is another area of application. The origin of changed material properties like colour, wear or corrosion resistance may, for example, be traced back to the inclusion of foreign bodies that hint at wear of machinery in the production process.

For quality control, micro-XRF can assist by providing measures of layer thickness, composition, and the homogeneity of crystal structure orientation.

This webinar highlights how micro-XRF is a versatile and powerful technique suitable for use in various industrial processes, not just academic research. Examples that will be presented include the quality control of thin layer samples and foreign body identification in the manufacturing process of battery electrodes.

Who Should Watch?

  • Micro-XRF users in industry
  • Quality control specialists assuring composition of metal or glass samples as well as failure analysis specialists in industry and material research laboratories
  • Researchers who work in R&D
Element distribution within two ICs which should have been identical. Micro-XRF can help to identify counterfeits or component changes.
Thickness distribution of yttrium iron garnet (YIG) on a wafer of gadolinium gallium garnet (GGG). Micro-XRF reveals undesirable radial inhomogeneities.

Speakers

Falk Reinhardt

Senior Application Scientist micro-XRF, Bruker Nano Analytics

Dr. Christian Hirschle

Application Scientist XMA, Bruker Nano Analytics

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