eWARP - The Fastest EBSD Detector Ever

eWARP is an award-winning direct electron EBSD detector. Powered by a revolutionary Bruker-engineered camera featuring a hybrid pixel sensor purpose-built for EBSD, eWARP delivers unparalleled performance while bringing direct electron detection to a much broader range of EBSD applications.

eWARP is by far the fastest and most signal efficient EBSD detector in the market. The detector can acquire EBSD maps at a speed of up to 14,400 patterns/second requiring only low-to-medium electron beam conditions, e.g., an accelerating voltage of 10 kV and a probe current of 12 nA.

eWARP’s unprecedented signal efficiency stems from its unique high collection rate, provided by the wide area pixels, and its high conversion rate generated by the silicon sensor designed for SEM electron energies.

eWARP is the next-generation core of our QUANTAX EBSD system. 

eWARP’s signal efficiency and speed gains represent a game changer for the EBSD community, opening new opportunities for researchers and analysts across a broader spectrum of EBSD applications. Here are a few examples that showcase the impact of eWARP’s performance:

• 3D EBSD – faster automatic acquisition of data cubes, using a plasma FIB-SEM, with higher pixel resolution or covering a larger volume.
• Time resolved mapping – acquisition of repetitive maps and images every few seconds to record microstructural changes inside the sample during in-situ heating and/or mechanical testing experiments.
• Large area mapping – analysis of bigger samples and/or with higher pixel resolution
• Beam sensitive materials – EBSD mapping is possible at very low electron doses.
• Improved data quality on martensitic or heavily deformed metals and alloys due to reduced interaction volume when operating at lower accelerating voltages, e.g. 10 kV.
• Enhanced spatial resolution for resolving the finest features of ultra-fine grained materials thanks to reduced accelerating voltage and probe current, even when operating at high speed.
• Excellent data integrity even on insulating materials thanks to improved beam stability.

eWARP’s direct electron detection enables faster and more signal-efficient EBSD analysis than ever before.

In this example see just how fast EBSD with eWARP really is, with the mapping of a duplex steel in just one minute under 10 kV and 12 nA electron beam.

Following automatic positioning of the detector using the ESPRIT software, a crisp color-coded FSE image is quickly acquired at 50k fps. The EBSD signal quality is then checked for both phases, followed by calibration. The EBSD map of 666k datapoints was acquired in only 47 seconds, i.e. at an ultra-high speed of 14600 pps. The indexing rate exceeded 99.5% . This level of speed and precision benefits all EBSD applications, whether high-throughput routine analysis or more in-depth advanced material research.

The first ever CMOS device with Bruker patented on-chip binning capability is the core of  eWARP. The sensor can acquire up to 350,000 patterns per second when operated  in binned mode. This lightning-fast operating mode can be used to simultaneously acquire five ForeScatter Electron (FSE) images showing various mix levels of orientation and topographic contrast. 

Additionally, eWARP's unique binning capability holds a huge potential for future development of new imaging capabilities.