Virtual Event, Actual Science

Nanoscale Surface Characterization of Polymeric Materials and Products

3 Sessions | 3 Practical Demos | Free to Access

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Explore Bruker's complete range of high-performance metrology techniques for the nanometer-scale surface characterization of polymeric materials and products.

  • Understand the applications, advantages, and considerations for using different property characterization methods.
  • View event-exclusive demonstrations of various tools and techniques for characterizing the nanoscale properties of polymeric samples.
  •  Hear Bruker experts answer live audience questions submitted by polymer researchers.

 

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Explore Tools and Techniques for Nanoscale Polymer Property Measurement

Presented by Peter De Wolf, Ph.D., WW Application Director, Bruker Nano Surfaces & Metrology (October 6, 2021)

Featuring a panel of Bruker application experts, the recording includes presentations and live technical demonstrations highlighting the features, capabilities, and practical use of Bruker's tools and techniques for nanoscale polymer property measurement.

Presentations topics includes:

  • High-resolution AFM-based measurement of nano-scale mechanical, electrical, and temperature-dependent properties
  • High-performance chemical characterizatiion via photothermal AFM-IR
  • Nanomechanical characterization of viscoelastic properties by nanoindentation
Recorded on Wednesday, October 6, 2021

Featured Presentations and Technical Demonstrations

Bruker is dedicated to providing a complete range of high-performance metrology techniques for the nanometer-scale surface characterization of polymeric materials and products.

Attendees of this virtual Surface Lab session can expect to explore a range of these characterization techniques as they are used by leading researchers in the field of polymer research.

With welcome address, introduction, live audience Q&A, and closing remarks by Dr. Peter De Wolf, Worldwide Application Director, Bruker

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For more information about this event or the products and techniques featured in it, please contact us or submit the form below.

Nanoscale Topography and Advanced Physical Property Characterization Using AFM

Dr. Heiko Haschke, Head of BioAFM Applications, Bruker
Dr. Mickael Febvre, Application Manager, Bruker
Dr. Thomas Henze, BioAFM Application Scientist, Bruker

When studying polymeric materials, AFM has many benefits over alternative techniques.

  • The sharp apex and precise force control provided by AFM enables researchers to probe heterogeneous sample surfaces with a resolution down to the nanometer level.
  • AFM enables the characterization of various material properties including but not limited to elastic and viscoelastic properties as well as electrical and thermal properties
  • AFM can be performed over a wide range of temperatures in both air and liquid, enabling the in-situ investigation of varying environmental conditions on sample properties. In additional, the fast scanning capabilities of AFM enable the detailed investigation of dynamic processes like crystallization and melting of polymers.

Several different AFM methods for measuring the properties of polymers will be covered, from high resolution elastic & viscoelastic mechanical property mapping to nano-electrical and temperature dependent measurements.

Nanoscale Spectroscopy and Imaging Using NanoIR – Photothermal AFM-IR Talk and live demo

Dr. Miriam Unger, NanoIR Application Scientist, Bruker
Dr. Hartmut Stadler, Application Scientist, Bruker

Combining IR spectroscopy with the high-resolution imaging capabilities of AFM enables the chemical characterization of polymeric materials. We will provide insights into new and existing photothermal AFM-IR techniques and demonstrate how to achieve high performance results.

Investigating the Influence of Environmental Conditions with Nano-Indentation

Dr. Ude Hangen, Nanoindentation Application Manager, Bruker
Dr. Jaroslav Lukes, Application Scientist, Bruker

Nano-mechanical characterization can also be achieved using nano-indentation methods.

We will

  • Introduce the technique
  • Present case studies examining viscoelastic properties using the nanoDMA method
  • Outline the influence of environmental conditions

Speakers

Peter Dewolf, Ph.D.
Worldwide Application Director, Bruker Nano Surfaces & Metrology

Peter De Wolf received his Ph.D in Electrical Engineering from the University Leuven, Belgium in 1998. His PhD work focused on the development of SPM based electrical characterization methods for semiconductors at IMEC in Belgium. He is co-inventor of several SPM methods & holder of several patents. Since 1998, Peter De Wolf works at Bruker (formerly Digital Instruments & Veeco Instruments) in both Santa Barbara, USA and Paris, France. At Bruker he held positions as R&D engineer and application development scientist and contributed in the development of electrical SPM methods including SSRM, TUNA, SCM, and DataCube methods. Currently, he is Worldwide Director of Applications – leading an international team of experts in SPM with laboratories located in Europe, USA, Asia and Japan, covering a broad range of SPM applications and operating modes

Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA

Miriam Unger, Ph.D.
Applications Manager EMEA, NanoIR, Bruker Nano GmbH

Hartmut Stadler, Ph.D., Application Scientist, Bruker

Heiko Haschke, Ph.D., Application Scientist, Bruker

Heiko Haschke received his Ph.D. in physics from the University of Bristol, UK, where he focused on the application and development of high-speed imaging and force spectroscopy for studying single biomolecular interactions. In 2001, he joined JPK Instrument AG as a developer of nanoanalytical instrumentation, in particular, AFMs and optical tweezers for biological applications. In 2004, he set up and became head of the Applications group, a team of applications scientist experts, providing worldwide customer and technical support. Since 2020, he is overseeing the worldwide applications development of the NanoRacer® high-speed AFM, from the BioAFM unit of Bruker Nano, based in Berlin, Germany.

Thomas Henze, Ph.D., BioAFM Application Scientist, Bruker

Ude Hangen, Ph.D.
Applications Manager, Bruker EMEA

Jaroslav Lukes, Ph.D., Applications Scientist, Bruker

Contact Us

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