Bruker at TechConnect World 2026
Visit us at Booth 510
Discover Bruker’s powerful portfolio of AFM, BioAFM, nanoIR, and surface metrology solutions, and connect with our experts to learn how our technologies are enabling breakthroughs across materials science, polymers, semiconductors, life sciences, and beyond.
- Learn about Dimension Nexus, Bruker’s next-generation AFM platform delivering high performance and excellent value.
- Explore the latest in nanoIR spectroscopy, including the new REFV technique for enhanced spatial resolution and sensitivity.
- Discover Bruker’s BioAFM solutions for high-resolution imaging of biological samples and mechanobiology studies.
- Get insights into our 3D optical profiling platforms for non-contact, high-precision surface characterization.
Talk to Our Experts
Our applications scientists and product specialists will be available throughout the show to discuss workflows, answer questions, and help you find the right solutions for your research or production environment. Schedule a meeting with our team here.
Conference Host:
Advanced Technology International
Conference Venue:
Raleigh Convention Center | Raleigh, NC
To find out more about this event or the products and technology featured in it:
Bruker Talks
Our scientists will be presenting throughout the conference—stop by to hear case studies, technical insights, and application highlights from Bruker’s thought leaders.
A versatile Peak Force IR variation for correlative nanoscale chemical and mechanical AFM-IR
Nanoscale infrared (nano-IR) microscopy enables label-free chemical imaging and spectroscopy at the nanometer scale by combining atomic force microscopy (AFM) with infrared radiation. AFM-IR has been used to explore the nanoscale chemical origins of biological processes including Amyloid Beta aggregation and bone calcification [1]. Over the years, AFM-IR has been developed further through coupling with different AFM imaging modes: the original photothermal induced resonance mode and the recently developed surface sensitive technique are based on contact mode, while Tapping AFM-IR is built on tapping mode [2]. Peak Force Tapping based Peak Force infrared (PFIR) microscopy [3] later joined as an additional AFM-IR mode. All these nano-IR variations inherit the advantages and limitations of their respective AFM base mode. In this work, we focus on the capabilities offered by a force curve-based AFM-IR-related approach, with improved signal-to-noise and deconvolution of signal origin with the addition of a gated output. We discuss (1) the capability to perform simultaneous multimodal imaging collecting both mechanical properties such as elastic modulus together with chemical information, (2) methods to understand and decouple artifacts induced by variations in mechanical properties from the AFM-IR data, and (3) the control of gate width and positioning to gain new material insights.
[1] A. Catarina V. D. dos Santos, N. Hondl, V. Ramos-Garcia, J. Kuligowski, B. Lendl, G. Ramer, ACS Meas. Sci. Au. 3, 5, 301–314, (2023).
[2] J. Mathurin, A. Deniset-Besseau, D. Bazin, E. Dartois, M. Wagner, A. Dazzi, J. Appl. Phys. 131, 010901 (2022).
[3] L. Wang, H. Wang, X. Xu, Chem. Soc. Rev. 51, 5268 (2022).
Session Title: SPM Connect Symposium: Multi-modal
Date: Tuesday, March 10th | 10:30 am
Authors/Presenters: C. Phillips, Q. Hu, C. Li, M. Wagner, P. De Wolf
Keywords: SPM, AFM, gated measurements, nanochemical spectroscopy, AFM-IR
High-resolution imaging of Van der Waals materials with Torsional Resonance Dynamic Friction Microscopy and Conductive AFM
Atomic Force Microscopy (AFM) was among the first techniques applied to the study of two-dimensional (2D) crystals such as graphene, and it remains a cornerstone of 2D material research. Identifying and characterizing single layers and multilayers is now routine, and with the appropriate choice of mode and probe, crystal orientation can often be determined. Because the AFM probe can function as a nanoscale electrode, it enables direct measurement of electrical properties with sub-nanometer resolution—making AFM uniquely suited for simultaneous structural and functional characterization. Torsional resonance (TR) modes in AFM have recently gained renewed attention for their utility in this domain. TR dynamic friction microscopy (TR-DFM), which operates at the torsional contact resonance frequency, allows atomic-scale imaging under ambient conditions—resolving component lattices, moiré superlattices, twist angles, and lattice strain. Phase-locked loop (PLL) tracking further enhances contrast by distinguishing local variations in shear stiffness and damping. Complementary to TR-DFM, conductive AFM (C-AFM) has proven effective in mapping local conductivity with atomic resolution. Given the central importance of electronic properties in 2D systems, C-AFM provides critical insight into charge transport and heterogeneity, enriching the structural data obtained from TR-based modes. Together, these techniques establish torsional resonance and conductive AFM as complementary, high-resolution platforms for multidimensional characterization of 2D materials—advancing the design and understanding of next-generation electronic, optoelectronic, and quantum devices.
Session Title: SPM Connect Symposium: Multi-frequency
Date: Wednesday, March 11th | 01:30 pm
Authors/Presenters: B. Pittenger, M. Ye, P. De Wolf
Keywords: torsional resonance, AFM, SPM, 2D materials, Van der Waals materials
Learn More About the new Dimension Nexus
Dimension Nexus™ delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker's NanoScope® 6 controller, PeakForce Tapping® technology, and ScanAsyst® Plus self-optimizing imaging software to deliver more functionality than competing systems in its class. Suitable for both routine and custom experiments and easily upgradable in the field, Dimension Nexus is both an excellent starter system and a perfect addition to any thriving AFM lab.
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