BRUKER NANO ANALYTICS PRESENTS:

M4 TORNADO PLUS - A New Era in micro-XRF

On-Demand Session - 60 Minutes

Material Analysis with M4 TORNADO micro X-ray Fluorescence

Bruker invites you to get to know the M4 TORNADOPLUS, the latest member of the proven, market leading family of M4 TORNADO Micro-XRF analyzers.

Micro X-ray fluorescence is a universal technique for material analysis of a broad range of samples in terms of size, shape or composition. The M4 TORNADOPLUS offers several novel features that enhance the typical Micro-XRF fields of application towards geoscience and mining, biology, polymer research or semiconductor industry, among others.

Using super light detector entrance windows and an optimized X-ray tube, the M4 TORNADOPLUS extends the detectable element range from typically sodium/magnesium down to carbon. Therewith fluorine, oxygen, and nitrogen, as well as the L-lines of 3d transition metals (Ti-Zn), are accessible for micro-XRF analysis.

Another key feature is the fully software-controlled collimator changer for the second X-ray tube, which enables to choose between 4 different spot sizes for the analysis of heavy elements. The collimator can be set to spot sizes of 0.5 mm, 1 mm, 2 mm, and 4.5 mm and is therefore adaptable to very different analytical challenges.

With the introduction of an optional computer-controlled He-purge system, even wet samples can now be measured over extended periods of time. It also allows light element detection in samples which should not be exposed to low pressures. The instrument's sensitivity under helium atmosphere for oxygen and above is similar to that of a 2 mbar environment.

For very uneven samples the depth of field can be increased by using the novel aperture management system (AMS), which allows spot sizes of less than half their usual size for measurements that are 4 mm out of focus.

All these new features will be live presented by our application specialists, who will be happy to answer all your questions during the Q&A session.

Highly 3-dimensional crystalline sample, measured with AMS - high depth of field
A fresh strawberry, analyzed over several hours in He atmosphere - no drying.

Who Should Attend?

Anyone using the Micro-XRF technique or those looking to incorporate this method into their research.

 

Speakers

Dr. Max Buegler

Application Scientist Micro-XRF, Bruker Nano Analytics

Falk Reinhardt

Senior Application Scientist micro-XRF, Bruker Nano Analytics

Watch this Webinar On-Demand

Please enter your details below to gain on-demand access to this webinar. 

Input value is invalid.

* Please fill out the mandatory fields.

Please enter your first name
Please enter your first name
Please enter your e-mail address
Please enter your first company / institution
What best describes my current situation:
Please accept the Terms and Conditions

* Please fill out the mandatory fields.

Thank you. Enjoy your On-Demand Webinar

 

Thank you for signing up to watch our on-demand webinar M4 TORNADO PLUS - A New Era in Micro-XRF. We have also sent an email to your registered address containing the link to watch the webinar. 

If you have questions about the content of the webinar or about any of our other products and services, please contact us at info.bna@bruker.com.

You can also contact our regional offices by email at: 

Europe, Middle East and Africa: support.bna.emea@bruker.com
Asia-Pacific: support.bna.apac@bruker.com
Americas: support.bna.americas@bruker.com