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▶ Watch On Demand | 1 Hr
AFM for Critical Dimension: Metrology of Trenches, Lines and Gratings
Explore the advantages of AFM in quality control feedback on fabrication processes
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Presented by: Senli Guo, Ph.D., Sales Applications Engineer, Bruker, and John Thornton, Engineer Sr. Applications, Bruker (July 26, 2022)
PRESENTATION HIGHLIGHTS:
[00:00:00]
Introduction
[00:00:56]
AFM is the Right Tool for Critical Dimension
[00:08:57]
PeakForce Tapping & Mode Selection for High Aspect Ratio Structures
[00:14:56]
Tip Selection for High Aspect Ratio Structures
[00:19:26]
Automation with Programmed Move & AutoMET
[00:30:16]
Live Demonstration: How to Measure a Patterned Sample
[00:43:32]
Q&A
Featured Products and Technology
Dimension Icon
Proven highest performance and versatility in an easily tunable AFM platform — now available as IconIR-ready
詳細はこちら
AutoMET Software
Enhanced nanoscale automation for high-throughput AFM and photothermal AFM-IR.
詳細はこちら
PeakForce Tapping
Highest resolution imaging and property mapping
詳細はこちら
Morphology Modes
Morphology modes are used to measure the nanoscale 3D structure of a surface.
詳細はこちら
AFM Modes
AFM modes and the broad capabilities from AFM beyond imaging
詳細はこちら
AFMs for Materials
Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.
詳細はこちら
E-Book: The Definitive AFM Modes Handbook
Everything you need to understand, select, and apply AFM techniques in materials research.
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