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AFM for Critical Dimension: Metrology of Trenches, Lines and Gratings

Explore the advantages of AFM in quality control feedback on fabrication processes

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by: Senli Guo, Ph.D., Sales Applications Engineer, Bruker, and John Thornton, Engineer Sr. Applications, Bruker (July 26, 2022)

_{PRESENTATION HIGHLIGHTS:}

[00:00:00] Introduction
[00:00:56] AFM is the Right Tool for Critical Dimension
[00:08:57] PeakForce Tapping & Mode Selection for High Aspect Ratio Structures
[00:14:56] Tip Selection for High Aspect Ratio Structures
[00:19:26] Automation with Programmed Move & AutoMET
[00:30:16] Live Demonstration: How to Measure a Patterned Sample
[00:43:32] Q&A

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PeakForce Tapping Mode - Submolecular-resolution adhesion on iPMMA. 100 nm image. (Sample courtesy of T. Thurn-Albrecht, Martin-Luther-Universitaet Halle-Wittenberg)

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