XFlash® 7100oval
The High Collection Angle Windowless EDS System for SEM, FIB-SEM and STEM-in-SEM
The oval geometry of the XFlash 7100oval detector facilitates SEM EDS at a high collection angle
This large area, high collection angle, windowless EDS detector with an oval-shaped 100 mm2 SDD is carefully customized for the specific geometry in SEM.
The unique shape and state of the art slim-line design allow to optimize the acquisition position achieving a solid angle for X-ray collection of up to 0.4 sr without compromising the SEM performance.
In summary, the XFlash® 7100oval offers the following advantages:
- 100 mm2 area, windowless
- Solid collection angle up to 0.4 sr, adaptions vary
- Maximum accelerating voltage on all SEM types: 30 keV
- Take-off angle of typically 30° … 35°
- Welded bellows and X-ray-tight shutter (optional)
- Non-interfering cooling system
- Automatic detector retraction system
- Excellent light element and low energy performance
- All advantages of Bruker’s versatile analysis software
Suggested areas of application for the XFlash® 7100oval are:
High-end element analysis by EDS in SEM, FIB-SEM and STEM-in-SEM aiming at:
- Low kV and beam sensitive samples
- Light element analysis
- High spatial resolution
- Fast data acquisition