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▶ Watch On-Demand | 2Hrs 5Minutes

On-Demand Session: What Can AFM Do for Polymer Research?

A Bruker AFM Symposium

Watch Individual Sessions:

Watch Now | 35 Minutes

A Selection of Modes and Methods for SPM Research of Polymers

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by Bede Pittenger, Ph.D. Sr. Staff Scientist, Bruker Nano Surfaces, AFM Applications, Bruker Nano Surfaces Inc., (July 22, 2020)
Watch Now | 30 Minutes

Atomic Force Microscopy in the Polymer Materials Industry

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by Dr. Greg Meyers, fellow Core R&D - Analytical Science, The Dow Chemical Company (July 22, 2020)
Watch Now | 13 Minutes

Recent Developments with Live Demonstration - PART 1 

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by Dr. Mickael Febvre, Bruker (July 22, 2020)
Watch Now | 35 Minutes

Nanoscale Electrical Characterization of Organic and Hybrid Materials for Energy Harvesting Applications

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by Dr. Philippe LECLERE, Associate Professor, University of Mons (July 22, 2020)
Watch Now | 11 Minutes

Recent Developments with Live Demonstration - PART 2 

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by Dr. Senli Guo (July 22, 2020)

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Innova AFM

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Best value research AFM that offers routine high-resolution imaging and flexibility
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High spatial resolution surface potential measurements on a wide range of samples
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Ultra-low current measurement on low-conductivity samples
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High-resolution current and topography mapping
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PeakForce TUNA Mode

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AFM modes and the broad capabilities from AFM beyond imaging
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AFM-Materials-BRUKER

AFMs for Materials

Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.
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AFMi-EB103 The Definitive AFM Modes Handbook-BRUKER 1

E-Book: The Definitive AFM Modes Handbook

Everything you need to understand, select, and apply AFM techniques in materials research.
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