Bruker applications specialists introduce the core principles of 3D optical profilometry for thin‑film and coated‑surface characterization. Time: ~10m
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Compare WLI with stylus scanning, confocal microscopy, and focus variation, highlighting differences in contact vs non‑contact measurement, data density, and applicable surface types. Start video at 38:48; time ~30m
Technical Demos
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Bruker specialists apply WLI measurement concepts to a real thin‑film sample, using a Sellotape/Kapton tape multi-layer film to show how measurements are executed and interpreted in practice. Start at 10:25; ~10 minutes
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Bruker applications experts demonstrate real‑time thin‑film thickness measurement using WLI on a transparent coating, from instrument and software setup to live data acquisition, fringe identification, and thickness calculation. Start at 01:03:51; ~ 35 minutes
See all presentations from our Thin Films & Coatings Symposium
