In this webinar we present the measurement setup and results of in-situ heating experiments with a combination of a commercially available heating TEM sample holder from DENSsolutions and an EDS detector of Bruker Nano Analytics.
The new Nano-Chip was developed to perform in-situ heating studies inside the (S)TEM, optimized to further increase in-plane stability and limit the bulging effect, making extreme high resolution imaging even easier. Additionally, the design of the heater allows to achieve better temperature homogeneity and to minimize power consumption and, therefore, minimize emitted infrared radiation. The latter is of particular interest for EDS acquisition, since IR radiation is disturbing the detection of the X-ray signal.
Energy dispersive X-ray spectra and maps were acquired on Au/Pd nanoparticles at temperatures up to 1000°C. The effects of IR-radiation on the X-ray spectra will be discussed in detail. We will present element distribution maps showing phenomena such as in-situ evaporation and phase changes, revealed by Bruker’s ESPRIT software.
The webinar will start with an introduction of the newly developed Nano-Chip heating TEM sample holder from DENSsolutions and continue with discussing the challenges and results of heating experiments of EDS data acquisition at high temperatures up to 1000°C by Bruker.
The webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.
Dr. Meiken Falke
Global Product Manager TEM-EDS, Bruker Nano Analytics
Dr. Igor Nemeth
Application Scientist EDS, Bruker Nano Analytics
Marketing Manager, DENSsolutions