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Latest Advances in Scanning Microwave Impedance Microscopy (SMIM)

Hear from our guest expert, Nicholas Antoniou (PrimeNano, Inc.), about the advantages and applications of sMIM

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Presented by Nicholas Antoniou, VP of Product Management, PrimeNano, Inc. with Ravi Chintala, Ph.D., Application Scientist, Bruker Nano Surfaces, and Peter Dewolf, Ph.D., Application Director, Bruker Nano Surfaces (March 2-3, 2022)

_{PRESENTATION HIGHLIGHTS:}

[00:00:00] Introduction

[00:04:05] What is Scanning Microwave Impedance Microscopy

[00:10:47] sMIM princple of operation

[00:16:00] General materials science examples

[00:24:13] Semiconductor carrier profiling example including scanwave pro solutions

[00:37:55] Dielectrics examples

[00:42:35] DataCube sMIM

[00:48:32] Comparison with other modes

[00:53:42] Q&A with guest expert Nicholas Antoniou (PrimeNano, Inc)

[00:58:12] Wrap-Up

Featured Products and Technology

Latest Advances in Scanning Microwave Impedance Microscopy (SMIM)

Featured Products and Technology

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E-Book: The Definitive AFM Modes Handbook