Nanochemical Atomic Force Microscopes

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in high value substrates


The Bruker JV-QCRT is a defect metrology system using the latest X-ray diffraction imaging (XRDI) technology to identify defects in high value substrates, such as CdTe and other dense materials.
Due to the nature of the X-ray diffraction, and unlike optical techniques, the wafer does not need to be etched or polished to be able to see the defects.



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JV QCRT tool imagev2
JV QCRT x ray detection dense material v1



Tilt and Defects on CdTe based substrates


CdTe and CdHgTe are widely used for IR detection, particularly for night vision, and in thin film solar cells. For these applications, the quality of the grown crystals becomes important. The JV-QCRT is used for the quality control of such crystals, and for the further development of the processing of these substrates.