QC-RT
QC-RT
The Bruker QC-RT is a defect metrology system using the latest X-ray diffraction imaging (XRDI) technology in reflection mode to identify defects in high value substrates, such as CdTe and other dense materials. Due to the nature of the X-ray diffraction, and unlike optical techniques, the wafer does not need to be etched or polished to be able to see the defects.
Tilts and Defects on CdTe Based Substrates
CdTe and CdHgTe are widely used for IR detection, particularly for night vision, and in thin film solar cells. For these applications, the quality of the grown crystals becomes important. The QC-RT is used for the quality control of such crystals, and for the further development of the processing of these substrates.
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Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.