AFM Industrial Reasearch banner v4

Cost-Effective Precision Metrology for R&D/QA/QC/FA

The Dimension® family of Atomic Force Microscopes (AFMs) have a long-standing reputation for providing the highest available speed and performance for industrial metrology applications. Designed specifically for high-volume, production environments, Dimension HPI and PRO systems enable automated measurements of many AFM modes while ensuring the utmost ease of use and the lowest cost per measurement for quality control, quality assurance, and failure analysis. Using contact, tapping, and PeakForce Tapping® mode techniques, these systems enable users to precisely control probe-to-sample interaction, providing long tip life-times with high-accuracy results in thousands of measurements

Dimension Icon H P I

Dimension HPI

Most Productive Industrial R&D AFM

Industrial AFM Dimension FastScan Pro v1

Dimension FastScan Pro

High-Resolution Industrial AFM

Industrial AFM Dimension Edge PSS v1

Dimension Edge PSS

3D Metrology for LED Resolution

Insight CAP Dual

InSight CAP

Compact Atomic Force Profiling for Production-Based Depth Metrology