M4 TORNADO, 2D µ-XRF, Ultimate Speed and Accuracy

Distribution Analysis of Electronic Components

As a fast, non-destructive and sensitive analytical method, Micro-XRF is well suited to examine electronic components. The M4 TORNADO provides important information on the elemental composition and can be used for:

  • the determination of the distribution of several elements
  • the control of RoHS elements and the compliance for every component
  • the quantification of specific areas of the sample for coating thickness determination or for the compositional analysis of special components
  • the non-destructive examination of ICs by measuring the high energetic fluorescence radiation

M4 TORNADO's feature HyperMap offers the possibility to sum spectra over larger, arbitrarily definable areas, providing excellent statistics for quantification.

Download the full lab report XRF 447 (PDF)