Multi-element XRF analysis for all kinds of samples, from carbon to americium

Elemental analysis as easy as 1,2,3

Energy-dispersive X-ray fluorescence (EDXRF) with the S2 PUMA offers all you need to measure and monitor elements in your samples, independent of the industry or environment you are working in. The outstanding strength of the S2 PUMA LE is the wide range of elements covered by the technique, from very light elements like C, to heavy elements like Am.

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For more details, please also see our new S2 PUMA App.


  • Unmatched detection limits, precision and speed in EDXRF by HighSense™ technology
  • Direct-excitation, closely coupled beam path
  • X-ray tube with up to 50 W power and 50 kV excitation voltage
  • XFlash SDD with excellent energy resolution
  • TouchControl™ touchscreen available for user-friendly routine analysis operation. Version without touchscreen for scenarios where instrument is controlled remotely
  • Light Element (LE) configuration with thin-window X-ray tube and XFlash X-ray detector

S2 PUMA with HighSense – the top-performing EDXRF

HighSense™ is the key to unrivaled analytical performance of the S2 PUMA. The instrument's direct excitation beam path makes full use of the 50-Watt power of the X-ray tube.

The optimal excitation of all elements in the sample is guaranteed with up to 50 kV voltage. The high-countrate, high-resolution XFlash silicon drift detector (SDD) further enhances the instrument's performance and records sample spectra in HD mode.


But that’s not all. With the all-new instrument X-ray optics, the distances between the X-ray tube, the sample and the detector are even shorter than before. This results in better detection limits, higher precision and shorter measurement times.


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