The ability to observe elemental changes within samples is important to understand geological processes and ore deposit genesis. The dual source system which incorporates a micro-XRF on a SEM enables elemental X-ray mapping over large areas, which shows major, minor and also trace elements on the ppm scale.
The figure shows a micro-XRF large area X-ray map (45 x 30 mm²) of a sample from an exotic copper deposit showing the element distribution information for copper (red), calcium (green), manganese (blue), silicon (purple), and chlorine (dark green). In addition, in this sample it is possible to detect trace elements such as Co and Sr that are not detectable by e-beam EDS as the concentrations are too low and/or the relevant element energy line is too high. Such information allows a greater understanding of their distribution and mineralogical and textural relationships and the deposit genesis.