Bruker’s Performech II Advanced Control Module provides the speed and precision necessary for rapid, reliable, and quantitative characterization to the low end of the nanoscale. Based on a state-of-the-art digital-signal-processor (DSP) with field-programmable-gate-array (FPGA) architecture, the Performech II delivers ultra-fast feedback control of user-definable test functions, data sampling rates, and data acquisition speeds.
Combined with industry-leading force and displacement noise floor performance, the Performech II enables 500x faster nanoindentation testing (XPM) for fast, high-resolution nanomechanical property mapping. Fully integrated multi-technique control capabilities allow the Performech II to seamlessly operate multiple Hysitron transducers, piezo scanners, and dynamic signal generators (nanoDMA III) with maximized signal synchronicity. The Performech II's modular controller design with auxiliary data acquisition and hardware control capabilities provides unparalleled flexibility and upgradability in nanomechanical and nanotribology-based characterization.
The Performech II Advanced Control Module delivers powerful force and displacement feedback control modes for precise and reliable control during nanomechanical and nanotribological characterization. All feedback control functionalities are performed onboard the Performech II Advanced Control Module by the dedicated DSP and FPGA embedded within the controller. Proprietary feedback control algorithms were specifically developed for the physics of Bruker’s Hysitron transducers as well as the rapidly changing indenter-specimen contact stiffness conditions that occur during nanoindentation. An ultra-fast feedback loop rate of 78 kHz, running on up to 24 channels simultaneously, assures the system can effectively respond to fast transient events such as dislocation nucleation, fracture, and thin film delamination while accurately reproducing any test function defined by the user.
Bruker’s XPM sets a new industry standard for nanomechanical testing throughput paired with measurement resolution and accuracy. At up to 6 nanoindentation measurements/second, XPM delivers comprehensive nanomechanical property maps and property distribution statistics in a record amount of time.
Any existing Hysitron TI Series nanoindentation system can be upgraded with the Performech II Advanced Control Module. Packaged with Bruker’s latest TriboScan 10 Control Software and Tribo iQ Data Analysis Package, the Performech II offers exciting new levels of performance, optimized multi-scale testing, increased speed and automation, enhanced simplicity, and advanced visualization. The Performech II upgrade takes existing Hysitron TI Series systems to the performance level of today’s cutting-edge technology.