Time Resolved Imaging and Mapping during In-Situ Heating and Electrical Biasing Experiments
OPTIMUS 2 with its new OPTIMUS Vue screen and the new ESPRIT TRM feature represent the perfect, must-have combination of tools for in-situ heating and electrical biasing experiments on electron transparent samples. Acquisition and saving of BF-like images, TKD and EDS maps is automatic and repeated for a user defined duration of time, e.g. duration of specific step or even entire experiment. This new and unique capability facilitates the capture of all important microstructural changes happening during very dynamic experiments like in-situ heating and electrical biasing.
Learn more here:
Elevated temperature transmission Kikuchi diffraction in the SEM
Alice Bastos Fanta; Matteo Todeschini; Andrew Burrows; Henri Jansen; Christian D. Damsgaard; Hossein Alimadadi; Jakob B. Wagner
Materials Characterization Volume 139, May 2018, Pages 452-462
In-Situ Analysis with eWARP TKD
This webnote discusses in-situ analysis using our legacy TKD solution, the eFlash FS detector equipped with an OPTIMUS 2 detector head, which has now been replaced by our next-generation eWARP TKD detector for ultra-fast, high-resolution transmission kikuchi diffraction.
The new eWARP is the optimal choice to capture rapid grain structure transformations occuring during in-situ experiments due to its incredible acquisition speed of up to 14,400 patterns per second.
